G01Q  10/00  \	0	0	2G580	G01Q  10/00	25	ޤϰַ֡ʤץ֤ư뤤ϰ֤ѶŪ椹뤿֡Σ	Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe [2010.01]
G01Q  10/02  \	1	1	2G580	G01Q  10/02	257	ưޤưַΣ	Coarse scanning or positioning [2010.01]
G01Q  10/02 101 \	2	2	2G580	G01Q  10/02	118	ǻҤѤ	by piezo-electric
G01Q  10/02 111 \	2	2	2G580	G01Q  10/02	161	Τβϩޤϥ르ꥺ	circuits or algorithms therefor
G01Q  10/04  \	1	1	2G580	G01Q  10/04	298	ưޤưַΣ	Fine scanning or positioning [2010.01]
G01Q  10/04 101 \	2	2	2G580	G01Q  10/04	463	ǻҤѤ	by piezo-electric
G01Q  10/06  \	2	2	2G580	G01Q  10/06	509	Τβϩޤϥ르ꥺΣ	Circuits or algorithms therefor [2010.01]
G01Q  20/00  \	0	0	2G580	G01Q  20/00	82	ץ֤ưޤϰ֤δƻΣ	Monitoring the movement or position of the probe [2010.01]
G01Q  20/02  \	1	1	2G580	G01Q  20/02	436	ŪʤˤΡΣ	by optical means [2010.01]
G01Q  20/04  \	1	1	2G580	G01Q  20/04	217	ʸΥץ֡ʤץּȤΰ֤򼨤褦ʿȯΡ㡥ťΣ	Self-detecting probes, i.e. wherein the probe itself generates a signal representative of its position, e.g. piezo-electric gauge [2010.01]
G01Q  30/00  \	0	0	2G580	G01Q  30/00	58	ץֵѤޤ֤ޤϲɤ˻񤹤Ūʡ㡥ɽ֤ޤϥǡ֡Σ	Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices [2010.01]
G01Q  30/02  \	1	1	2G580	G01Q  30/02	476	ӣУʬ֡㡥ӣţ͡ŻҸϡʬפޤϸظΣ	Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope [2010.01]
G01Q  30/04  \	1	1	2G580	G01Q  30/04	356	ɽ֤ޤϥǡ֡Σ	Display or data processing devices [2010.01]
G01Q  30/06  \	2	2	2G580	G01Q  30/06	171	顼ΤΤΡΣ	for error compensation [2010.01]
G01Q  30/08  \	1	1	2G580	G01Q  30/08	37	ץС˽˾δĶΩĴ᤹뤿μʡΣ	Means for establishing or regulating a desired environmental condition within a sample chamber [2010.01]
G01Q  30/10  \	2	2	2G580	G01Q  30/10	116	ٴĶΣ	Thermal environment [2010.01]
G01Q  30/12  \	2	2	2G580	G01Q  30/12	53	ήδĶΣ	Fluid environment [2010.01]
G01Q  30/14  \	3	3	2G580	G01Q  30/14	186	δĶΣ	Liquid environment [2010.01]
G01Q  30/16  \	2	2	2G580	G01Q  30/16	110	ĶΣ	Vacuum environment [2010.01]
G01Q  30/18  \	1	1	2G580	G01Q  30/18	120	δĶޤϱƶ饵ץСݸ뤤ϳΥ뤿μʡΣ	Means for protecting or isolating the interior of a sample chamber from external environmental conditions or influences, e.g. vibrations or electromagnetic fields [2010.01]
G01Q  30/20  \	1	1	2G580	G01Q  30/20	249	μ谷֤ޤϼʡΣ	Sample handling devices or methods [2010.01]
G01Q  40/00  \	0	0	2G580	G01Q  40/00	95	֥졼㡥ץ֤Υ֥졼Σ	Calibration, e.g. of probes [2010.01]
G01Q  40/02  \	1	1	2G580	G01Q  40/02	108	֥졼δޤϤ¤ˡΣ	Calibration standards or methods of fabrication thereof [2010.01]
G01Q  60/00  \	0	0	2G580	G01Q  60/00	96	ηΣӣУ͡ץַϤޤϤΤ֡δŪʹʡΣ	Particular types of SPM [Scanning-Probe Microscopy] or apparatus therefor; Essential components thereof [2010.01]
G01Q  60/02  \	1	1	2G580	G01Q  60/02	41	ޥףӣУ͡ʤĤޤϤʾΣӣУ͵ѤѤΡΣ	Multiple-type SPM, i.e. involving two or more SPM techniques [2010.01]
G01Q  60/04  \	2	2	2G580	G01Q  60/04	47	ӣԣ͡ȥͥ븲ˡϤȣƣ͡θҴϸˡϤȹ礻Σ	STM [Scanning Tunnelling Microscopy] combined with AFM [Atomic Force Microscopy] [2010.01]
G01Q  60/06  \	2	2	2G580	G01Q  60/06	47	ӣΣϣ͡ζظˡϤȣƣ͡θҴϸˡϤȹ礻Σ	SNOM [Scanning Near-field Optical Microscopy] combined with AFM [Atomic Force Microscopy] [2010.01]
G01Q  60/08  \	2	2	2G580	G01Q  60/08	10	ͣƣ͡μϸˡϤȣƣ͡θҴϸˡϤȹ礻Σ	MFM [Magnetic Force Microscopy] combined with AFM [Atomic Force Microscopy] [2010.01]
G01Q  60/10  \	1	1	2G580	G01Q  60/10	1206	ӣԣ͡ȥͥ븲ˡϤޤϤΤ֡㡥ӣԣѥץ֡Σ	STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes [2010.01]
G01Q  60/12  \	2	2	2G580	G01Q  60/12	69	ӣԣӡȥͥ륹ڥȥԡϡΣ	STS [Scanning Tunnelling Spectroscopy] [2010.01]
G01Q  60/14  \	2	2	2G580	G01Q  60/14	14	ӣԣСȥͥݥƥ󥷥ȥ꡼ϡΣ	STP [Scanning Tunnelling Potentiometry] [2010.01]
G01Q  60/16  \	2	2	2G580	G01Q  60/16	0	ץ֤ޤϤ¤ޤϴϢࡤ㡥ץ֥ۥΣ	Probes, their manufacture or their related instrumentation, e.g. holders [2010.01]
G01Q  60/16 101 \	3	3	2G580	G01Q  60/16	212	ץ֤	probe characteristics
G01Q  60/16 111 \	3	3	2G580	G01Q  60/16	159	ץ֤¤	probe manufacture
G01Q  60/18  \	1	1	2G580	G01Q  60/18	485	ӣΣϣ͡ζظˡϤޤϤΤ֡㡥ӣΣϣѤΥץ֡Σ	SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes [2010.01]
G01Q  60/20  \	2	2	2G580	G01Q  60/20	44	ָΣ	Fluorescence [2010.01]
G01Q  60/22  \	2	2	2G580	G01Q  60/22	6	ץ֤ޤϤ¤ޤϴϢࡤ㡥ץ֥ۥΣ	Probes, their manufacture or their related instrumentation, e.g. holders [2010.01]
G01Q  60/22 101 \	3	3	2G580	G01Q  60/22	521	ץ֤	probe characteristics
G01Q  60/22 111 \	3	3	2G580	G01Q  60/22	289	ץ֤¤	probe manufacture
G01Q  60/24  \	1	1	2G580	G01Q  60/24	1215	ƣ͡θҴϸˡϤޤϤΤ֡㡥ƣѤΥץ֡Σ	AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes [2010.01]
G01Q  60/26  \	2	2	2G580	G01Q  60/26	96	໤ϸˡΣ	Friction force microscopy [2010.01]
G01Q  60/28  \	2	2	2G580	G01Q  60/28	73	ϸˡΣ	Adhesion force microscopy [2010.01]
G01Q  60/30  \	2	2	2G580	G01Q  60/30	152	ݥƥ󥷥븲ˡΣ	Scanning potential microscopy [2010.01]
G01Q  60/32  \	2	2	2G580	G01Q  60/32	379	å⡼ɡΣ	AC mode [2010.01]
G01Q  60/34  \	3	3	2G580	G01Q  60/34	95	åԥ󥰥⡼ɡΣ	Tapping mode [2010.01]
G01Q  60/36  \	2	2	2G580	G01Q  60/36	50	ģå⡼ɡΣ	DC mode [2010.01]
G01Q  60/38  \	2	2	2G580	G01Q  60/38	16	ץ֤ޤϤ¤ޤϴϢࡤ㡥ץ֥ۥΣ	Probes, their manufacture or their related instrumentation, e.g. holders [2010.01]
G01Q  60/38 101 \	3	3	2G580	G01Q  60/38	382	ץ֤	probe characteristics
G01Q  60/38 111 \	3	3	2G580	G01Q  60/38	243	ץ֤¤	probe manufacture
G01Q  60/40  \	3	3	2G580	G01Q  60/40	159	Ƴץ֡Σ	Conductive probes [2010.01]
G01Q  60/42  \	3	3	2G580	G01Q  60/42	65	ǽΣ	Functionalisation [2010.01]
G01Q  60/44  \	1	1	2G580	G01Q  60/44	21	ӣɣã͡󥳥󥹸ˡϤޤϤΤ֡㡥ӣɣãѤΥץ֡Σ	SICM [Scanning Ion-Conductance Microscopy] or apparatus therefor, e.g. SICM probes [2010.01]
G01Q  60/44 101 \	2	2	2G580	G01Q  60/44	9	ץ֤ޤϤ¤ޤϴϢࡤ㡥ץ֥ۥ	probes, their manufacture or their related instrumentation, e.g. holders
G01Q  60/46  \	1	1	2G580	G01Q  60/46	102	ӣã͡ѥ󥹸ˡϤޤϤΤ֡㡥ӣãѤΥץ֡Σ	SCM [Scanning Capacitance Microscopy] or apparatus therefor, e.g. SCM probes [2010.01]
G01Q  60/48  \	2	2	2G580	G01Q  60/48	23	ץ֤ޤϤ¤ޤϴϢࡤ㡥ץ֥ۥΣ	Probes, their manufacture or their related instrumentation, e.g. holders [2010.01]
G01Q  60/50  \	1	1	2G580	G01Q  60/50	188	ͣƣ͡μϸˡϤޤϤΤ֡㡥ͣƣѤΥץ֡Σ	MFM [Magnetic Force Microscopy] or apparatus therefor, e.g. MFM probes [2010.01]
G01Q  60/52  \	2	2	2G580	G01Q  60/52	22	ġΣ	Resonance [2010.01]
G01Q  60/54  \	2	2	2G580	G01Q  60/54	3	ץ֤ޤϤ¤ޤϴϢࡤ㡥ץ֥ۥΣ	Probes, their manufacture or their related instrumentation, e.g. holders [2010.01]
G01Q  60/54 101 \	3	3	2G580	G01Q  60/54	74	ץ֤	probe characteristics
G01Q  60/54 111 \	3	3	2G580	G01Q  60/54	44	ץ֤¤	probe manufacture
G01Q  60/56  \	3	3	2G580	G01Q  60/56	31	ƥ󥰤줿ץ֡Σ	Probes with magnetic coating [2010.01]
G01Q  60/58  \	1	1	2G580	G01Q  60/58	45	ӣԣ͡ǮˡϤޤϤΤ֡㡥ӣԣѤΥץ֡Σ	SThM [Scanning Thermal Microscopy] or apparatus therefor, e.g. SThM probes [2010.01]
G01Q  60/60  \	1	1	2G580	G01Q  60/60	57	ӣţã͡ŵظˡϤޤϤΤ֡㡥ӣţãѤΥץ֡Σ	SECM [Scanning Electro-Chemical Microscopy] or apparatus therefor, e.g. SECM probes [2010.01]
G01Q  60/60 101 \	2	2	2G580	G01Q  60/60	19	ץ֤ޤϤ¤ޤϴϢࡤ㡥ץ֥ۥ	Probes, their manufacture or their related instrumentation, e.g. holders
G01Q  70/00  \	0	0	2G580	G01Q  70/00	8	ӣУͥץ֤ΰŪޤϤ¤ޤϴϢǡ롼ףǣѣޤñΣӣУ͵ѤäŬ礷ƤʤΡΣ	General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q 60/00 [2010.01]
G01Q  70/02  \	1	1	2G580	G01Q  70/02	169	ץ֥ۥΣ	Probe holders [2010.01]
G01Q  70/04  \	2	2	2G580	G01Q  70/04	27	١ưͶ줿顼ΤΡΣ	with compensation for temperature or vibration induced errors [2010.01]
G01Q  70/06  \	1	1	2G580	G01Q  70/06	252	ץ֥åץ쥤Σ	Probe tip arrays [2010.01]
G01Q  70/08  \	1	1	2G580	G01Q  70/08	57	ץ֤Σ	Probe characteristics [2010.01]
G01Q  70/10  \	2	2	2G580	G01Q  70/10	152	ޤϥơѡΣ	Shape or taper [2010.01]
G01Q  70/12  \	3	3	2G580	G01Q  70/12	165	ʥΥ塼֥åסΣ	Nano-tube tips [2010.01]
G01Q  70/14  \	2	2	2G580	G01Q  70/14	110	ʪΣ	Particular materials [2010.01]
G01Q  70/16  \	1	1	2G580	G01Q  70/16	275	ץ֤¤Σ	Probe manufacture [2010.01]
G01Q  70/18  \	2	2	2G580	G01Q  70/18	45	ǽΣ	Functionalisation [2010.01]
G01Q  80/00  \	0	0	2G580	G01Q  80/00	13	ӣУͤץֵѤαѡʥޥ¤¤ޤϽ£áʥι¤ʪ¤ޤϽ££ܾߺѤѤεϿȺǣ£ǣ£ǣ£ˡΣ	Applications, other than SPM, of scanning-probe techniques (manufacture or treatment of micro-structures B81C; manufacture or treatment of nano-structures B82B 3/00; recording or reproducing information using near-field interaction G11B 9/12, G11B 11/24&nbsp;or G11B 13/08) [2010.01]
G01Q  80/00 101 \	1	1	2G580	G01Q  80/00	887	Ͽ֤ؤŬ	application to information storage apparatuses
G01Q  80/00 111 \	1	1	2G580	G01Q  80/00	371	ɽ̲ùؤŬ	application to surface treatment
G01Q  80/00 121 \	1	1	2G580	G01Q  80/00	216	ʪؤŬ	application to biological sample
G01Q  90/00  \	0	0	2G580	G01Q  90/00	82	¾ʬवʤץֵѤޤ֡Σ	Scanning-probe techniques or apparatus not otherwise provided for [2010.01]
