G01Q  10/00		ޤϰַ֡ʤץ֤ư뤤ϰ֤ѶŪ椹뤿֡Σ	Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe	1018
G01Q  10/02		ưޤưַΣ	Coarse scanning or positioning	654
G01Q  10/04		ưޤưַΣ	Fine scanning or positioning	1379
G01Q  10/06		Τβϩޤϥ르ꥺΣ	Circuits or algorithms therefor	887
G01Q  20/00		ץ֤ưޤϰ֤δƻΣ	Monitoring the movement or position of the probe	343
G01Q  20/02		ŪʤˤΡΣ	by optical means	934
G01Q  20/04		ʸΥץ֡ʤץּȤΰ֤򼨤褦ʿȯΡ㡥ťΣ	Self-detecting probes, i.e. wherein the probe itself generates a signal representative of its position, e.g. piezoelectric gauge	452
G01Q  30/00		ץֵѤޤ֤ޤϲɤ˻񤹤Ūʡ㡥ɽ֤ޤϥǡ֡Σ	Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices	347
G01Q  30/02		ӣУʬ֡㡥ӣţ͡ŻҸϡʬפޤϸظΣ	Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope	1756
G01Q  30/04		ɽ֤ޤϥǡ֡Σ	Display or data processing devices	1049
G01Q  30/06		顼ΤΤΡΣ	for error compensation	358
G01Q  30/08		ץС˽˾δĶΩĴ᤹뤿μʡΣ	Means for establishing or regulating a desired environmental condition within a sample chamber	449
G01Q  30/10		ٴĶΣ	Thermal environment	292
G01Q  30/12		ήδĶΣ	Fluid environment	143
G01Q  30/14		δĶΣ	Liquid environment	284
G01Q  30/16		ĶΣ	Vacuum environment	302
G01Q  30/18		δĶޤϱƶ饵ץСݸ뤤ϳΥ뤿μʡΣ	Means for protecting or isolating the interior of a sample chamber from external environmental conditions or influences, e.g. vibrations or electromagnetic fields	228
G01Q  30/20		μ谷֤ޤϼʡΣ	Sample handling devices or methods	1302
G01Q  40/00		֥졼㡥ץ֤Υ֥졼Σ	Calibration, e.g. of probes	361
G01Q  40/02		֥졼δޤϤ¤ˡΣ	Calibration standards or methods of fabrication thereof	232
G01Q  60/00		ηΣӣУ͡ץַϤޤϤΤ֡δŪʹʡΣ	Particular types of SPM [Scanning-Probe Microscopy] or apparatus therefor; Essential components thereof	1039
G01Q  60/02		ޥףӣУ͡ʤĤޤϤʾΣӣУ͵ѤѤΡΣ	Multiple-type SPM, i.e. involving two or more SPM techniques	123
G01Q  60/04		ӣԣ͡ȥͥ븲ˡϤȣƣ͡θҴϸˡϤȹ礻Σ	STM [Scanning Tunnelling Microscopy] combined with AFM [Atomic Force Microscopy]	113
G01Q  60/06		ӣΣϣ͡ζظˡϤȣƣ͡θҴϸˡϤȹ礻Σ	SNOM [Scanning Near-field Optical Microscopy] combined with AFM [Atomic Force Microscopy]	126
G01Q  60/08		ͣƣ͡μϸˡϤȣƣ͡θҴϸˡϤȹ礻Σ	MFM [Magnetic Force Microscopy] combined with AFM [Atomic Force Microscopy]	35
G01Q  60/10		ӣԣ͡ȥͥ븲ˡϤޤϤΤ֡㡥ӣԣѥץ֡Σ	STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes	1779
G01Q  60/12		ӣԣӡȥͥ륹ڥȥԡϡΣ	STS [Scanning Tunnelling Spectroscopy]	152
G01Q  60/14		ӣԣСȥͥݥƥ󥷥ȥ꡼ϡΣ	STP [Scanning Tunnelling Potentiometry]	67
G01Q  60/16		ץ֤ޤϤ¤ޤϴϢࡤ㡥ץ֥ۥΣ	Probes, their manufacture or their related instrumentation, e.g. holders	873
G01Q  60/18		ӣΣϣ͡ζظˡϤޤϤΤ֡㡥ӣΣϣѤΥץ֡Σ	SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes	1016
G01Q  60/20		ָΣ	Fluorescence	94
G01Q  60/22		ץ֤ޤϤ¤ޤϴϢࡤ㡥ץ֥ۥΣ	Probes, their manufacture or their related instrumentation, e.g. holders	1029
G01Q  60/24		ƣ͡θҴϸˡϤޤϤΤ֡㡥ƣѤΥץ֡Σ	AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes	3326
G01Q  60/26		໤ϸˡΣ	Friction force microscopy	178
G01Q  60/28		ϸˡΣ	Adhesion force microscopy	123
G01Q  60/30		ݥƥ󥷥븲ˡΣ	Scanning potential microscopy	345
G01Q  60/32		å⡼ɡΣ	AC mode	534
G01Q  60/34		åԥ󥰥⡼ɡΣ	Tapping mode	204
G01Q  60/36		ģå⡼ɡΣ	DC mode	148
G01Q  60/38		ץ֤ޤϤ¤ޤϴϢࡤ㡥ץ֥ۥΣ	Probes, their manufacture or their related instrumentation, e.g. holders	1854
G01Q  60/40		Ƴץ֡Σ	Conductive probes	328
G01Q  60/42		ǽΣ	Functionalisation	213
G01Q  60/44		ӣɣã͡󥳥󥹸ˡϤޤϤΤ֡㡥ӣɣãѤΥץ֡Σ	SICM [Scanning Ion-Conductance Microscopy] or apparatus therefor, e.g. SICM probes	121
G01Q  60/46		ӣã͡ѥ󥹸ˡϤޤϤΤ֡㡥ӣãѤΥץ֡Σ	SCM [Scanning Capacitance Microscopy] or apparatus therefor, e.g. SCM probes	159
G01Q  60/48		ץ֤ޤϤ¤ޤϴϢࡤ㡥ץ֥ۥΣ	Probes, their manufacture or their related instrumentation, e.g. holders	52
G01Q  60/50		ͣƣ͡μϸˡϤޤϤΤ֡㡥ͣƣѤΥץ֡Σ	MFM [Magnetic Force Microscopy] or apparatus therefor, e.g. MFM probes	283
G01Q  60/52		ġΣ	Resonance	56
G01Q  60/54		ץ֤ޤϤ¤ޤϴϢࡤ㡥ץ֥ۥΣ	Probes, their manufacture or their related instrumentation, e.g. holders	183
G01Q  60/56		ƥ󥰤줿ץ֡Σ	Probes with magnetic coating	74
G01Q  60/58		ӣԣ͡ǮˡϤޤϤΤ֡㡥ӣԣѤΥץ֡Σ	SThM [Scanning Thermal Microscopy] or apparatus therefor, e.g. SThM probes	129
G01Q  60/60		ӣţã͡ŵظˡϤޤϤΤ֡㡥ӣţãѤΥץ֡Σ	SECM [Scanning Electro-Chemical Microscopy] or apparatus therefor, e.g. SECM probes	173
G01Q  70/00		ӣУͥץ֤ΰŪޤϤ¤ޤϴϢǡ롼ףǣѣޤñΣӣУ͵ѤäŬ礷ƤʤΡΣ	General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group <b>G01Q60/00</b>	366
G01Q  70/02		ץ֥ۥΣ	Probe holders	395
G01Q  70/04		١ưͶ줿顼ΤΡΣ	with compensation for temperature or vibration induced errors	107
G01Q  70/06		ץ֥åץ쥤Σ	Probe tip arrays	423
G01Q  70/08		ץ֤Σ	Probe characteristics	322
G01Q  70/10		ޤϥơѡΣ	Shape or taper	432
G01Q  70/12		ʥΥ塼֥åסΣ	Nanotube tips	356
G01Q  70/14		ʪΣ	Particular materials	416
G01Q  70/16		ץ֤¤Σ	Probe manufacture	709
G01Q  70/18		ǽΣ	Functionalisation	136
G01Q  80/00		ӣУͤץֵѤαѡʥޥ¤¤ޤϽ£áʥι¤ʪ¤ޤϽ££ܾߺѤѤεϿȺǣ£ǣ£ǣ£ˡΣ	Applications, other than SPM, of scanning-probe techniques(manufacture or treatment of microstructures <b>B81C</b>; manufacture or treatment of nanostructures <b>B82B3/00</b>; recording or reproducing information using near-field interaction <b>G11B9/12</b>, <b>G11B11/24</b> or <b>G11B13/08</b>)	1876
G01Q  90/00		¾ʬवʤץֵѤޤ֡Σ	Scanning-probe techniques or apparatus not otherwise provided for	1124
