G01R1/00	7	Details of instruments or arrangements of the types included in groups G01R5/00&#160;-&#160;G01R13/00 and G01R31/00(constructional details particular to {electromechanical} arrangements for measuring the electric consumption G01R11/02)	G01R1/00	G01R1/00		284
G01R1/02	8	General constructional details	G01R1/02	G01R1/02		6784
G01R1/025	9	{concerning dedicated user interfaces, e.g. GUI, or dedicated keyboards (G01R31/31912 takes precedence)}	G01R1/02	G01R1/02		427
G01R1/04	9	Housings; Supporting members; Arrangements of terminals	G01R1/04	G01R1/04		11078
G01R1/0408	10	{Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets (G01R1/067 takes precedence; mass production testing systems G01R31/59; testing of connections G01R31/66; for testing printed circuit boards G01R31/2808)}	G01R1/04	G01R1/04		10463
G01R1/0416	11	{Connectors, terminals (G01R1/0425 and G01R1/0433 take precedence; with measurement function for battery poles G01R31/364)}	G01R1/04	G01R1/04		6792
G01R1/0425	11	{Test clips, e.g. for IC&apos;s}	G01R1/04	G01R1/04		3756
G01R1/0433	11	{Sockets for IC&apos;s or transistors}	G01R1/04	G01R1/04		1018
G01R1/0441	12	{Details}	G01R1/04	G01R1/04		322
G01R1/045	13	{Sockets or component fixtures for RF or HF testing}	G01R1/04	G01R1/04		273
G01R1/0458	13	{related to environmental aspects, e.g. temperature}	G01R1/04	G01R1/04		341
G01R1/0466	13	{concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding}	G01R1/04	G01R1/04		2034
G01R1/0475	12	{for TAB IC&apos;s}	G01R1/04	G01R1/04		32
G01R1/0483	12	{Sockets for unleaded IC&apos;s having matrix type contact fields, e.g. BGA or PGA devices; Sockets for unpackaged, naked chips}	G01R1/04	G01R1/04		1064
G01R1/0491	11	{for testing integrated circuits on wafers, e.g. wafer-level test cartridge}	G01R1/04	G01R1/04		381
G01R1/06	9	Measuring leads; Measuring probes (G01R19/145, G01R19/165 take precedence)	G01R1/06	G01R1/06		520
G01R1/067	10	Measuring probes	G01R1/067	G01R1/067		2008
G01R1/06705	11	{Apparatus for holding or moving single probes (for moving multiple probe heads or ICs under test G01R31/2886)}	G01R1/067	G01R1/067		904
G01R1/06711	11	{Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins}	G01R1/067	G01R1/067		973
G01R1/06716	12	{Elastic}	G01R1/067	G01R1/067		1056
G01R1/06722	13	{Spring-loaded}	G01R1/067	G01R1/067		1834
G01R1/06727	13	{Cantilever beams}<br><br><u>WARNING</u><br> This group is not complete pending a reorganisation; see also other subgroups of G01R1/06711	G01R1/067	G01R1/067		558
G01R1/06733	12	{Geometry aspects (G01R1/06727 takes precedence)}	G01R1/067	G01R1/067		1855
G01R1/06738	13	{related to tip portion}	G01R1/067	G01R1/067		1058
G01R1/06744	13	{Microprobes, i.e. having dimensions as IC details}	G01R1/067	G01R1/067		342
G01R1/0675	13	{Needle-like}	G01R1/067	G01R1/067		368
G01R1/06755	12	{Material aspects}	G01R1/067	G01R1/067		670
G01R1/06761	13	{related to layers}	G01R1/067	G01R1/067		557
G01R1/06766	11	{Input circuits therefor}	G01R1/067	G01R1/067		316
G01R1/06772	11	{High frequency probes}	G01R1/067	G01R1/067		878
G01R1/06777	11	{High voltage probes}	G01R1/067	G01R1/067		151
G01R1/06783	11	{containing liquids}	G01R1/067	G01R1/067		70
G01R1/06788	11	{Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments (end pieces terminating in a probe H01R11/18)}	G01R1/067	G01R1/067		1036
G01R1/06794	11	{Devices for sensing when probes are in contact, or in position to contact, with measured object}	G01R1/067	G01R1/067		393
G01R1/07	11	Non contact-making probes	G01R1/07	G01R1/07		299
G01R1/071	12	{containing electro-optic elements}	G01R1/07	G01R1/07		245
G01R1/072	12	{containing ionised gas}	G01R1/07	G01R1/07		21
G01R1/073	11	Multiple probes	G01R1/073	G01R1/073		2476
G01R1/07307	12	{with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card}	G01R1/073	G01R1/073		2146
G01R1/07314	13	{the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support (on an elastic support, e.g. a film, G01R1/0735)}	G01R1/073	G01R1/073		2008
G01R1/07321	14	{the probes being of different lengths}	G01R1/073	G01R1/073		53
G01R1/07328	14	{for testing printed circuit boards}	G01R1/073	G01R1/073		567
G01R1/07335	15	{for double-sided contacting or for testing boards with surface-mounted devices (SMD&apos;s)}	G01R1/073	G01R1/073		66
G01R1/07342	13	{the body of the probe being at an angle other than perpendicular to test object, e.g. probe card}	G01R1/073	G01R1/073		1423
G01R1/0735	13	{arranged on a flexible frame or film}	G01R1/073	G01R1/073		757
G01R1/07357	13	{with flexible bodies, e.g. buckling beams}	G01R1/073	G01R1/073		955
G01R1/07364	13	{with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch}	G01R1/073	G01R1/073		310
G01R1/07371	14	{using an intermediate card or back card with apertures through which the probes pass}	G01R1/073	G01R1/073		667
G01R1/07378	14	{using an intermediate adapter, e.g. space transformers (G01R1/07371 takes precedence)}	G01R1/073	G01R1/073		1004
G01R1/07385	14	{using switching of signals between probe tips and test bed, i.e. the standard contact matrix which in its turn connects to the tester}	G01R1/073	G01R1/073		88
G01R1/07392	12	{manipulating each probe element or tip individually}	G01R1/073	G01R1/073		249
G01R1/08	9	Pointers; Scales; Scale illumination	G01R1/08	G01R1/08		269
G01R1/10	9	Arrangements of bearings	G01R1/10	G01R1/10		201
G01R1/12	10	of strip or wire bearings	G01R1/12	G01R1/12		141
G01R1/14	9	Braking arrangements; Damping arrangements	G01R1/14	G01R1/14		197
G01R1/16	9	Magnets	G01R1/16	G01R1/16		152
G01R1/18	9	Screening arrangements against electric or magnetic fields, e.g. against earth&apos;s field	G01R1/18	G01R1/18		1289
G01R1/20	8	Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments	G01R1/20	G01R1/20		774
G01R1/203	9	{Resistors used for electric measuring, e.g. decade resistors standards, resistors for comparators, series resistors, shunts (resistors in general H01C; microwave or radiowave terminations H01P1/26; coupling devices H01R)}	G01R1/20	G01R1/20		2210
G01R1/206	9	{Switches for connection of measuring instruments or electric motors to measuring loads (switches in general H01H)}	G01R1/20	G01R1/20		708
G01R1/22	9	Tong testers acting as secondary windings of current transformers	G01R1/22	G01R1/22		460
G01R1/24	9	Transmission-line, e.g. waveguide, measuring sections, e.g. slotted section	G01R1/24	G01R1/24		155
G01R1/26	10	with linear movement of probe	G01R1/26	G01R1/26		41
G01R1/28	8	Provision in measuring instruments for reference values, e.g. standard voltage, standard waveform	G01R1/28	G01R1/28		2946
G01R1/30	8	Structural combination of electric measuring instruments with basic electronic circuits, e.g. with amplifier	G01R1/30	G01R1/30		2562
G01R1/36	8	Overload-protection arrangements or circuits for electric measuring instruments	G01R1/36	G01R1/36		921
G01R1/38	8	Arrangements for altering the indicating characteristic, e.g. by modifying the air gap	G01R1/38	G01R1/38		88
G01R1/40	8	Modifications of instruments to indicate the maximum or the minimum value reached in a time interval, e.g. by maximum indicator pointer	G01R1/40	G01R1/40		36
G01R1/42	9	thermally operated	G01R1/42	G01R1/42		4
G01R1/44	8	Modifications of instruments for temperature compensation	G01R1/44	G01R1/44		341
G01R3/00	7	Apparatus or processes specially adapted for the manufacture {or maintenance} of measuring instruments {, e.g. of probe tips}	G01R3/00	G01R3/00		3531
G01R5/00	7	Instruments for converting a single current or a single voltage into a mechanical displacement	G01R5/00	G01R5/00		54
G01R5/02	8	Moving-coil instruments	G01R5/02	G01R5/02		54
G01R5/04	9	with magnet external to the coil	G01R5/04	G01R5/04		300
G01R5/06	9	with core magnet	G01R5/06	G01R5/06		106
G01R5/08	9	specially adapted for wide angle deflection; with eccentrically-pivoted moving coil	G01R5/08	G01R5/08		100
G01R5/10	8	String galvanometers	G01R5/10	G01R5/10		50
G01R5/12	8	Loop galvanometers	G01R5/12	G01R5/12		6
G01R5/14	8	Moving-iron instruments	G01R5/14	G01R5/14		680
G01R5/16	9	with pivoting magnet	G01R5/16	G01R5/16		147
G01R5/18	9	with pivoting soft iron, e.g. needle galvanometer	G01R5/18	G01R5/18		23
G01R5/20	8	Induction instruments, e.g. Ferraris instruments	G01R5/20	G01R5/20		63
G01R5/22	8	Thermoelectric instruments	G01R5/22	G01R5/22		59
G01R5/24	9	operated by elongation of a strip or wire or by expansion of a gas or fluid	G01R5/24	G01R5/24		7
G01R5/26	9	operated by deformation of a bimetallic element	G01R5/26	G01R5/26		17
G01R5/28	8	Electrostatic instruments	G01R5/28	G01R5/28		234
G01R5/30	9	Leaf electrometers	G01R5/30	G01R5/30		15
G01R5/32	9	Wire electrometers; Needle electrometers	G01R5/32	G01R5/32		7
G01R5/34	9	Quadrant electrometers	G01R5/34	G01R5/34		4
G01R7/00	7	Instruments capable of converting two or more currents or voltages into a single mechanical displacement (G01R9/00 takes precedence)	G01R7/00	G01R7/00		24
G01R7/02	8	for forming a sum or a difference	G01R7/02	G01R7/02		41
G01R7/04	8	for forming a quotient (for measuring resistance G01R27/08)	G01R7/04	G01R7/04		5
G01R7/06	9	moving-iron type<br><br><u>NOTE</u><br><br>This group covers all crossed-coil meters, i.e. logometers having a magnetic rotor	G01R7/06	G01R7/06		240
G01R7/08	9	moving-coil type, e.g. crossed-coil type	G01R7/08	G01R7/08		25
G01R7/10	10	having more than two moving coils	G01R7/10	G01R7/10		1
G01R7/12	8	for forming product	G01R7/12	G01R7/12		10
G01R7/14	9	moving-iron type	G01R7/14	G01R7/14		4
G01R7/16	9	having both fixed and moving coils, i.e. dynamometers	G01R7/16	G01R7/16		7
G01R7/18	10	with iron core magnetically coupling fixed and moving coils	G01R7/18	G01R7/18		7
G01R9/00	7	Instruments employing mechanical resonance	G01R9/00	G01R9/00		13
G01R9/02	8	Vibration galvanometers, e.g. for measuring current	G01R9/02	G01R9/02		15
G01R9/04	8	using vibrating reeds, e.g. for measuring frequency	G01R9/04	G01R9/04		11
G01R9/06	9	magnetically driven	G01R9/06	G01R9/06		5
G01R9/08	9	piezoelectrically driven	G01R9/08	G01R9/08		7
G01R11/00	7	Electromechanical arrangements for measuring time integral of electric power or current, e.g. of consumption (monitoring electric consumption of electrically-propelled vehicles B60L3/00)<br><br><u>NOTE</u><br><br>Groups G01R11/48 - G01R11/56 take precedence over groups G01R11/30 - G01R11/46. <br>This Note corresponds to IPC Note (1) relating to G01R11/30 - G01R11/46.<br>For the definition of "arrangement" see Note (2) under G01R	G01R11/00	G01R11/00		776
G01R11/02	8	Constructional details	G01R11/02	G01R11/02		1747
G01R11/04	9	Housings; Supporting racks; Arrangements of terminals	G01R11/04	G01R11/04		4484
G01R11/06	9	Magnetic circuits of induction meters	G01R11/06	G01R11/06		66
G01R11/067	10	Coils therefor	G01R11/067	G01R11/067		21
G01R11/073	10	Armatures therefor	G01R11/073	G01R11/073		3
G01R11/09	11	Disc armatures	G01R11/09	G01R11/09		21
G01R11/10	9	Braking magnets; Damping arrangements	G01R11/10	G01R11/10		541
G01R11/12	9	Arrangements of bearings	G01R11/12	G01R11/12		272
G01R11/14	10	with magnetic relief	G01R11/14	G01R11/14		134
G01R11/16	9	Adaptations of counters to electricity meters	G01R11/16	G01R11/16		159
G01R11/17	9	Compensating for errors; Adjusting or regulating means therefor	G01R11/17	G01R11/17		145
G01R11/18	10	Compensating for variations in ambient conditions	G01R11/18	G01R11/18		29
G01R11/185	11	Temperature compensation	G01R11/185	G01R11/185		228
G01R11/19	10	Compensating for errors caused by disturbing torque, e.g. rotating-field errors of polyphase meters	G01R11/19	G01R11/19		11
G01R11/20	10	Compensating for phase errors in induction meters	G01R11/20	G01R11/20		29
G01R11/21	10	Compensating for errors caused by damping effects of the current, e.g. adjustment in the overload range	G01R11/21	G01R11/21		15
G01R11/22	10	Adjusting torque, e.g. adjusting starting torque, adjusting of polyphase meters for obtaining equal torques	G01R11/22	G01R11/22		16
G01R11/23	10	Compensating for errors caused by friction, e.g. adjustment in the light load range	G01R11/23	G01R11/23		11
G01R11/24	9	Arrangements for avoiding or indicating fraudulent use	G01R11/24	G01R11/24		1501
G01R11/25	9	Arrangements for indicating or signalling faults	G01R11/25	G01R11/25		331
G01R11/30	8	Dynamo-electric motor meters	G01R11/30	G01R11/30		533
G01R11/32	9	Watt-hour meters	G01R11/32	G01R11/32		506
G01R11/34	9	Ampere-hour meters	G01R11/34	G01R11/34		31
G01R11/36	8	Induction meters, e.g. Ferraris meters	G01R11/36	G01R11/36		1338
G01R11/38	9	for single-phase operation	G01R11/38	G01R11/38		12
G01R11/40	9	for polyphase operation	G01R11/40	G01R11/40		284
G01R11/42	10	Circuitry therefor	G01R11/42	G01R11/42		47
G01R11/46	8	Electrically-operated clockwork meters; Oscillatory meters; Pendulum meters	G01R11/46	G01R11/46		107
G01R11/465	9	{Oscillatory meters}	G01R11/46	G01R11/46		9
G01R11/48	8	Meters specially adapted for measuring real or reactive components; Meters specially adapted for measuring apparent energy	G01R11/48	G01R11/48		243
G01R11/50	9	for measuring real component	G01R11/50	G01R11/50		47
G01R11/52	9	for measuring reactive component	G01R11/52	G01R11/52		103
G01R11/54	9	for measuring simultaneously at least two of the following three variables: real component, reactive component, apparent energy	G01R11/54	G01R11/54		51
G01R11/56	8	Special tariff meters	G01R11/56	G01R11/56		1113
G01R11/57	9	Multi-rate meters (G01R11/63 takes precedence)	G01R11/57	G01R11/57		77
G01R11/58	10	Tariff-switching devices therefor	G01R11/58	G01R11/58		68
G01R11/60	9	Subtraction meters; Meters measuring maximum or minimum load hours	G01R11/60	G01R11/60		737
G01R11/63	9	Over-consumption meters, e.g. measuring consumption while a predetermined level of power is exceeded	G01R11/63	G01R11/63		75
G01R11/64	9	Maximum meters, e.g. tariff for a period is based on maximum demand within that period	G01R11/64	G01R11/64		157
G01R11/66	10	Circuitry	G01R11/66	G01R11/66		15
G01R13/00	7	Arrangements for displaying electric variables or waveforms	G01R13/00	G01R13/00		1312
G01R13/02	8	for displaying measured electric variables in digital form	G01R13/02	G01R13/02		1068
G01R13/0209	9	{in numerical form}	G01R13/02	G01R13/02		405
G01R13/0218	9	{Circuits therefor}	G01R13/02	G01R13/02		254
G01R13/0227	10	{Controlling the intensity or colour of the display}	G01R13/02	G01R13/02		77
G01R13/0236	10	{for presentation of more than one variable}	G01R13/02	G01R13/02		111
G01R13/0245	10	{for inserting reference markers}	G01R13/02	G01R13/02		40
G01R13/0254	10	{for triggering, synchronisation}	G01R13/02	G01R13/02		319
G01R13/0263	11	{for non-recurrent functions, e.g. transients}	G01R13/02	G01R13/02		31
G01R13/0272	10	{for sampling}	G01R13/02	G01R13/02		280
G01R13/0281	9	{using electro-optic elements}	G01R13/02	G01R13/02		119
G01R13/029	9	{Software therefor}	G01R13/02	G01R13/02		381
G01R13/04	8	for producing permanent records	G01R13/04	G01R13/04		974
G01R13/06	9	Modifications for recording transient disturbances, e.g. by starting or accelerating a recording medium	G01R13/06	G01R13/06		156
G01R13/08	9	Electromechanical recording systems using a mechanical direct-writing method	G01R13/08	G01R13/08		109
G01R13/10	10	with intermittent recording by representing the variable by the length of a stroke or by the position of a dot	G01R13/10	G01R13/10		42
G01R13/12	9	Chemical recording, e.g. clydonographs (G01R13/14 takes precedence)	G01R13/12	G01R13/12		62
G01R13/14	9	Recording on a light-sensitive material	G01R13/14	G01R13/14		53
G01R13/16	9	Recording on a magnetic medium	G01R13/16	G01R13/16		21
G01R13/18	10	using boundary displacement	G01R13/18	G01R13/18		2
G01R13/20	8	Cathode-ray oscilloscopes	G01R13/20	G01R13/20		357
G01R13/202	9	{Non-electric appliances, e.g. scales, masks (luminescent screens for CRT provided with permanent marks or references H01J29/34; optical or photographic arrangements combined with CRT vessels H01J29/89)}	G01R13/20	G01R13/20		57
G01R13/204	9	{Using means for generating permanent registrations, e.g. photographs (optical or photographic arrangements combined with CRT vessel H01J29/89)}	G01R13/20	G01R13/20		101
G01R13/206	9	{Arrangements for obtaining a 3- dimensional representation (stereoscopic T.V. H04N13/00)}	G01R13/20	G01R13/20		34
G01R13/208	9	{Arrangements for measuring with C.R. oscilloscopes, e.g. vectorscope}	G01R13/20	G01R13/20		211
G01R13/22	9	Circuits therefor	G01R13/22	G01R13/22		413
G01R13/225	10	{particularly adapted for storage oscilloscopes}	G01R13/22	G01R13/22		62
G01R13/24	10	Time-base deflection circuits	G01R13/24	G01R13/24		154
G01R13/245	11	{for generating more than one, not overlapping time-intervals on the screen}	G01R13/24	G01R13/24		21
G01R13/26	10	Circuits for controlling the intensity of the electron beam {or the colour of the display}	G01R13/26	G01R13/26		108
G01R13/28	10	Circuits for simultaneous or sequential presentation of more than one variable	G01R13/28	G01R13/28		290
G01R13/30	10	Circuits for inserting reference markers, e.g. for timing, for calibrating, for frequency marking	G01R13/30	G01R13/30		271
G01R13/305	11	{for time marking}	G01R13/30	G01R13/30		13
G01R13/32	10	Circuits for displaying non-recurrent functions such as transients; Circuits for triggering; Circuits for synchronisation; Circuits for time-base expansion	G01R13/32	G01R13/32		353
G01R13/325	11	{for displaying non-recurrent functions such as transients}	G01R13/32	G01R13/32		120
G01R13/34	10	Circuits for representing a single waveform by sampling, e.g. for very high frequencies	G01R13/34	G01R13/34		154
G01R13/342	11	{for displaying periodic H.F. signals (G01R13/345 takes precedence)}	G01R13/34	G01R13/34		97
G01R13/345	11	{for displaying sampled signals by using digital processors by intermediate A.D. and D.A. convertors (control circuits for CRT indicators)}	G01R13/34	G01R13/34		367
G01R13/347	11	{using electro-optic elements}	G01R13/34	G01R13/34		84
G01R13/36	8	using length of glow discharge, e.g. glowlight oscilloscopes	G01R13/36	G01R13/36		18
G01R13/38	8	using the steady or oscillatory displacement of a light beam by an electromechanical measuring system	G01R13/38	G01R13/38		111
G01R13/40	8	using modulation of a light beam otherwise than by mechanical displacement, e.g. by Kerr effect {(visual indication of correct tuning H03J3/14)}	G01R13/40	G01R13/40		256
G01R13/401	9	{for continuous analogue, or simulated analogue, display}	G01R13/40	G01R13/40		16
G01R13/402	10	{using active, i.e. light-emitting display devices, e.g. electroluminescent display (G01R13/36 and G01R13/42 take precedence)}	G01R13/40	G01R13/40		58
G01R13/403	10	{using passive display devices, e.g. liquid crystal display or Kerr effect display devices}	G01R13/40	G01R13/40		99
G01R13/404	9	{for discontinuous display, i.e. display of discrete values (analogue/digital conversion H03M1/00)}	G01R13/40	G01R13/40		95
G01R13/405	10	{using a plurality of active, i.e. light emitting, e.g. electro-luminescent elements, i.e. bar graphs}	G01R13/40	G01R13/40		281
G01R13/406	11	{representing measured value by a dot or a single line (G01R13/408 takes precedence)}	G01R13/40	G01R13/40		114
G01R13/407	10	{using a plurality of passive display elements, e.g. liquid crystal or Kerr-effect display elements (G01R13/408 takes precedence)}	G01R13/40	G01R13/40		96
G01R13/408	10	{Two or three dimensional representation of measured values}	G01R13/40	G01R13/40		123
G01R13/42	8	Instruments using length of spark discharge, e.g. by measuring maximum separation of electrodes to produce spark	G01R13/42	G01R13/42		17
G01R15/00	7	Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26&#160;or G01R35/00	G01R15/00	G01R15/00		788
G01R15/002	8	{Switches for altering the measuring range or for multitesters}	G01R15/00	G01R15/00		292
G01R15/005	8	{Circuits for altering the indicating characteristic, e.g. making it non-linear}	G01R15/00	G01R15/00		302
G01R15/007	9	{by zero-suppression}	G01R15/00	G01R15/00		33
G01R15/04	8	Voltage dividers	G01R15/04	G01R15/04		1164
G01R15/06	9	having reactive components, e.g. capacitive transformer	G01R15/06	G01R15/06		722
G01R15/08	8	Circuits for altering the measuring range	G01R15/08	G01R15/08		436
G01R15/09	9	Autoranging circuits	G01R15/09	G01R15/09		462
G01R15/12	8	Circuits for multi-testers {, i.e. multimeters}, e.g. for measuring voltage, current, or impedance at will	G01R15/12	G01R15/12		860
G01R15/125	9	{for digital multimeters}	G01R15/12	G01R15/12		539
G01R15/14	8	Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks	G01R15/14	G01R15/14		926
G01R15/142	9	{Arrangements for simultaneous measurements of several parameters employing techniques covered by groups G01R15/14&#160;-&#160;G01R15/26}	G01R15/14	G01R15/14		438
G01R15/144	9	{Measuring arrangements for voltage not covered by other subgroups of G01R15/14}	G01R15/14	G01R15/14		262
G01R15/146	9	{Measuring arrangements for current not covered by other subgroups of G01R15/14, e.g. using current dividers, shunts, or measuring a voltage drop (if no voltage isolation is involved G01R1/203 or G01R19/0092)}	G01R15/14	G01R15/14		678
G01R15/148	10	{involving the measuring of a magnetic field or electric field (G01R15/18, G01R15/20, G01R15/24, G01R15/26 take precedence)}	G01R15/14	G01R15/14		259
G01R15/16	9	using capacitive devices	G01R15/16	G01R15/16		894
G01R15/165	10	{measuring electrostatic potential, e.g. with electrostatic voltmeters or electrometers, when the design of the sensor is essential (electrometers with passively moving electrodes G01R5/28; measuring electrostatic fields G01R29/12; measuring charge G01R29/24; measuring in circuits with high internal resistance G01R19/0023)}	G01R15/16	G01R15/16		153
G01R15/18	9	using inductive devices, e.g. transformers	G01R15/18	G01R15/18		2674
G01R15/181	10	{using coils without a magnetic core, e.g. Rogowski coils}	G01R15/18	G01R15/18		1193
G01R15/183	10	{using transformers with a magnetic core}	G01R15/18	G01R15/18		917
G01R15/185	11	{with compensation or feedback windings or interacting coils, e.g. 0-flux sensors (using galvano-magnetic field sensors G01R15/20; conversion of DC into AC using transductors G01R19/20)}	G01R15/18	G01R15/18		633
G01R15/186	10	{using current transformers with a core consisting of two or more parts, e.g. clamp-on type (G01R15/142&#160;-&#160;G01R15/16 take precedence; tong testers G01R1/22)}	G01R15/18	G01R15/18		431
G01R15/188	10	{comprising rotatable parts, e.g. moving coils (galvanometers G01R5/02, G01R5/14)}	G01R15/18	G01R15/18		75
G01R15/20	9	using galvano-magnetic devices, e.g. Hall-effect devices {, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices}	G01R15/20	G01R15/20		1116
G01R15/202	10	{using Hall-effect devices (Hall elements in arrangements for measuring electrical power G01R21/08)}	G01R15/20	G01R15/20		2007
G01R15/205	10	{using magneto-resistance devices, e.g. field plates}	G01R15/20	G01R15/20		842
G01R15/207	10	{Constructional details independent of the type of device used}	G01R15/20	G01R15/20		1356
G01R15/22	9	using light-emitting devices, e.g. LED, optocouplers {(G01R31/31901 takes precedence)}	G01R15/22	G01R15/22		625
G01R15/24	9	using light-modulating devices	G01R15/24	G01R15/24		551
G01R15/241	10	{using electro-optical modulators, e.g. electro-absorption (probes containing electro-optic elements G01R1/071)}	G01R15/24	G01R15/24		215
G01R15/242	11	{based on the Pockels effect, i.e. linear electro-optic effect}	G01R15/24	G01R15/24		205
G01R15/243	11	{based on the Kerr effect, i.e. quadratic electro-optic effect}	G01R15/24	G01R15/24		17
G01R15/245	10	{using magneto-optical modulators, e.g. based on the Faraday or Cotton-Mouton effect}	G01R15/24	G01R15/24		153
G01R15/246	11	{based on the Faraday, i.e. linear magneto-optic, effect}	G01R15/24	G01R15/24		614
G01R15/247	10	{Details of the circuitry or construction of devices covered by G01R15/241&#160;-&#160;G01R15/246}	G01R15/24	G01R15/24		244
G01R15/248	10	{using a constant light source and electro-mechanically driven deflectors}	G01R15/24	G01R15/24		66
G01R15/26	9	using modulation of waves other than light, e.g. radio or acoustic waves	G01R15/26	G01R15/26		112
G01R17/00	7	Measuring arrangements involving comparison with a reference value, e.g. bridge	G01R17/00	G01R17/00		880
G01R17/02	8	Arrangements in which the value to be measured is automatically compared with a reference value	G01R17/02	G01R17/02		555
G01R17/04	9	in which the reference value is continuously or periodically swept over the range of values to be measured	G01R17/04	G01R17/04		186
G01R17/06	9	Automatic balancing arrangements	G01R17/06	G01R17/06		219
G01R17/08	10	in which a force or torque representing the measured value is balanced by a force or torque representing the reference value	G01R17/08	G01R17/08		379
G01R17/10	8	AC or DC measuring bridges	G01R17/10	G01R17/10		311
G01R17/105	9	{for measuring impedance or resistance}	G01R17/10	G01R17/10		574
G01R17/12	9	using comparison of currents, e.g. bridges with differential current output	G01R17/12	G01R17/12		38
G01R17/14	9	with indication of measured value by calibrated null indicator, e.g. percent bridge, tolerance bridge (G01R17/12, G01R17/16 take precedence)	G01R17/14	G01R17/14		8
G01R17/16	9	with discharge tubes or semiconductor devices in one or more arms of the bridge, e.g. voltmeter using a difference amplifier	G01R17/16	G01R17/16		209
G01R17/18	9	with more than four branches	G01R17/18	G01R17/18		10
G01R17/20	8	AC or DC potentiometric measuring arrangements	G01R17/20	G01R17/20		108
G01R17/22	9	with indication of measured value by calibrated null indicator	G01R17/22	G01R17/22		6
G01R19/00	7	Arrangements for measuring currents or voltages or for indicating presence or sign thereof (G01R5/00 takes precedence; for measuring bioelectric currents or voltages A61B5/24)<br><br><u>NOTE</u><br><br> Within groups G01R19/02&#160;-&#160;G01R19/32, group G01R19/28 takes precedence. Groups G01R19/18&#160;-&#160;G01R19/257 take precedence over groups G01R19/02&#160;-&#160;G01R19/17 and G01R19/30. 	G01R19/00	G01R19/00		7272
G01R19/0007	8	{Frequency selective voltage or current level measuring (measuring frequency G01R23/00; testing attenuation in line transmission systems H04B3/48; monitoring testing in transmission systems H04B17/00)}	G01R19/00	G01R19/00		257
G01R19/0015	9	{separating AC and DC}	G01R19/00	G01R19/00		79
G01R19/0023	8	{Measuring currents or voltages from sources with high internal resistance by means of measuring circuits with high input impedance, e.g. OP-amplifiers (electrostatic instruments G01R5/28; measuring electrostatic potential G01R15/165; measuring electrostatic fields G01R29/12; amplifiers per seH03F)}	G01R19/00	G01R19/00		500
G01R19/003	8	{Measuring mean values of current or voltage during a given time interval}	G01R19/00	G01R19/00		683
G01R19/0038	8	{Circuits for comparing several input signals and for indicating the result of this comparison, e.g. equal, different, greater, smaller (comparing pulses or pulse trains according to amplitude)}	G01R19/00	G01R19/00		1061
G01R19/0046	8	{characterised by a specific application or detail not covered by any other subgroup of G01R19/00}	G01R19/00	G01R19/00		237
G01R19/0053	9	{Noise discrimination; Analog sampling; Measuring transients (measuring characteristics of individual pulses G01R29/02; digital sampling G01R19/2509; measuring noise figure G01R29/26)}	G01R19/00	G01R19/00		585
G01R19/0061	9	{Measuring currents of particle-beams, currents from electron multipliers, photocurrents, ion currents; Measuring in plasmas}	G01R19/00	G01R19/00		327
G01R19/0069	9	{measuring voltage or current standards}	G01R19/00	G01R19/00		76
G01R19/0076	9	{using thermionic valves}	G01R19/00	G01R19/00		89
G01R19/0084	8	{Measuring voltage only}	G01R19/00	G01R19/00		4362
G01R19/0092	8	{Measuring current only}	G01R19/00	G01R19/00		8719
G01R19/02	8	Measuring effective values, i.e. root-mean-square values	G01R19/02	G01R19/02		1035
G01R19/03	9	using thermoconverters	G01R19/03	G01R19/03		65
G01R19/04	8	Measuring peak values {or amplitude or envelope} of AC or of pulses	G01R19/04	G01R19/04		1683
G01R19/06	8	Measuring real component; Measuring reactive component	G01R19/06	G01R19/06		168
G01R19/08	8	Measuring current density	G01R19/08	G01R19/08		211
G01R19/10	8	Measuring sum, difference or ratio	G01R19/10	G01R19/10		2498
G01R19/12	8	Measuring rate of change	G01R19/12	G01R19/12		841
G01R19/14	8	Indicating direction of current; Indicating polarity of voltage	G01R19/14	G01R19/14		654
G01R19/145	8	Indicating the presence of current or voltage	G01R19/145	G01R19/145		1934
G01R19/15	9	Indicating the presence of current	G01R19/15	G01R19/15		838
G01R19/155	9	Indicating the presence of voltage	G01R19/155	G01R19/155		1747
G01R19/165	8	Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values	G01R19/165	G01R19/165		4130
G01R19/16504	9	{characterised by the components employed}	G01R19/165	G01R19/165		146
G01R19/16509	10	{using electromagnetic relays, e.g. reed relay (magnetically driven reeds G01R9/06)}	G01R19/165	G01R19/165		128
G01R19/16514	10	{using electronic tubes}	G01R19/165	G01R19/165		38
G01R19/16519	10	{using FET&apos;s}	G01R19/165	G01R19/165		485
G01R19/16523	10	{using diodes, e.g. Zener diodes}	G01R19/165	G01R19/165		239
G01R19/16528	9	{using digital techniques or performing arithmetic operations (using digital techniques to measure a voltage or a current, seeG01R19/25)}	G01R19/165	G01R19/165		1500
G01R19/16533	9	{characterised by the application}	G01R19/165	G01R19/165		453
G01R19/16538	10	{in AC or DC supplies (G01R19/16519 and G01R19/16528 take precedence)}	G01R19/165	G01R19/165		1376
G01R19/16542	11	{for batteries (charge condition monitoring in G01R31/36)}	G01R19/165	G01R19/165		3111
G01R19/16547	11	{voltage or current in AC supplies (switching for protection H02H; circuits for emergency power supply H02J9/00)}	G01R19/165	G01R19/165		704
G01R19/16552	11	{in I.C. power supplies}	G01R19/165	G01R19/165		418
G01R19/16557	10	{Logic probes, i.e. circuits indicating logic state (high, low, O); (modifications of electronic switches or gates for indicating state of switch H03K17/18)}	G01R19/165	G01R19/165		203
G01R19/16561	10	{in hand-held circuit testers (see also G01R19/155)}	G01R19/165	G01R19/165		85
G01R19/16566	9	{Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533}	G01R19/165	G01R19/165		1012
G01R19/16571	10	{comparing AC or DC current with one threshold, e.g. load current, over-current, surge current or fault current (G01R19/16514, G01R19/16519, G01R19/16528, G01R19/16533, G01R19/1659 take precedence; measuring currents by using elements sensitive to the magnetic field generated G01R15/14; measuring earth resistance G01R27/18; testing for leakage or short circuits in electrical apparatus G01R31/52)}	G01R19/165	G01R19/165		2793
G01R19/16576	10	{comparing DC or AC voltage with one threshold (G01R19/16514, G01R19/16519, G01R19/16528, G01R19/16533 and G01R19/1659 take precedence)}	G01R19/165	G01R19/165		2673
G01R19/1658	11	{AC voltage or recurrent signals}	G01R19/165	G01R19/165		189
G01R19/16585	10	{for individual pulses, ripple or noise and other applications where timing or duration is of importance (G01R19/16519, G01R19/16538 and G01R19/16595 take precedence; for pulse duration and rise time, seeG01R29/02 and subgroups)}	G01R19/165	G01R19/165		217
G01R19/1659	10	{to indicate that the value is within or outside a predetermined range of values (window) (G01R19/16514, G01R19/16519, G01R19/16528 and G01R19/16533 take precedence)}	G01R19/165	G01R19/165		1040
G01R19/16595	11	{with multi level indication (G01R19/16519 and G01R19/16533 take precedence)}	G01R19/165	G01R19/165		134
G01R19/17	9	giving an indication of the number of times this occurs {, i.e. multi-channel analysers}	G01R19/17	G01R19/17		428
G01R19/175	8	Indicating the instants of passage of current or voltage through a given value, e.g. passage through zero	G01R19/175	G01R19/175		1397
G01R19/18	8	using conversion of DC into AC, e.g. with choppers	G01R19/18	G01R19/18		380
G01R19/20	9	using transductors {, i.e. a magnetic core transducer the saturation of which is cyclically reversed by an AC source on the secondary side}	G01R19/20	G01R19/20		338
G01R19/22	8	using conversion of AC into DC	G01R19/22	G01R19/22		810
G01R19/225	9	{by means of thermocouples or other heat sensitive elements}	G01R19/22	G01R19/22		130
G01R2019/24	9	{using thermocouples}	G01R19/22	G01R19/24		1
G01R19/25	8	using digital measurement techniques	G01R19/25	G01R19/25		4419
G01R19/2503	9	{for measuring voltage only, e.g. digital volt meters (DVM&apos;s) (G01R19/2506&#160;-&#160;G01R19/257 take precedence)}	G01R19/25	G01R19/25		1172
G01R19/2506	9	{Arrangements for conditioning or analysing measured signals, e.g. for indicating peak values (G01R19/003 takes precedence); Details concerning sampling, digitizing or waveform capturing (displaying waveforms G01R13/00; analog sampling G01R19/0053)}	G01R19/25	G01R19/25		1062
G01R19/2509	10	{Details concerning sampling, digitizing or waveform capturing}	G01R19/25	G01R19/25		1357
G01R19/2513	9	{Arrangements for monitoring electric power systems, e.g. power lines or loads; Logging}	G01R19/25	G01R19/25		2641
G01R19/2516	9	{Modular arrangements for computer based systems; using personal computers (PC&apos;s), e.g. "virtual instruments"}	G01R19/25	G01R19/25		151
G01R19/252	9	using analogue/digital converters of the type with conversion of voltage or current into frequency and measuring of this frequency	G01R19/252	G01R19/252		475
G01R19/255	9	using analogue/digital converters of the type with counting of pulses during a period of time proportional to voltage or current, delivered by a pulse generator with fixed frequency	G01R19/255	G01R19/255		200
G01R19/257	9	using analogue/digital converters of the type with comparison of different reference values with the value of voltage or current, e.g. using step-by-step method	G01R19/257	G01R19/257		323
G01R19/28	8	adapted for measuring in circuits having distributed constants	G01R19/28	G01R19/28		174
G01R19/30	8	Measuring the maximum or the minimum value of current or voltage reached in a time interval (G01R19/04 takes precedence)	G01R19/30	G01R19/30		572
G01R19/32	8	Compensating for temperature change	G01R19/32	G01R19/32		696
G01R21/00	7	Arrangements for measuring electric power or power factor (G01R7/12 takes precedence)	G01R21/00	G01R21/00		2957
G01R21/001	8	{Measuring real or reactive component; Measuring apparent energy (G01R21/01, G01R21/02, G01R21/08, G01R21/10 and G01R21/127 take precedence)}	G01R21/00	G01R21/00		224
G01R21/002	9	{Measuring real component}	G01R21/00	G01R21/00		516
G01R21/003	9	{Measuring reactive component}	G01R21/00	G01R21/00		363
G01R21/005	9	{Measuring apparent power}	G01R21/00	G01R21/00		91
G01R21/006	8	{Measuring power factor}	G01R21/00	G01R21/00		564
G01R21/007	8	{Adapted for special tariff measuring (G01R21/01, G01R21/02, G01R21/08, G01R21/10, G01R21/1278 and G01R21/1333 take precedence)}	G01R21/00	G01R21/00		156
G01R21/008	9	{Measuring maximum demand}	G01R21/00	G01R21/00		42
G01R21/01	8	in circuits having distributed constants (G01R21/04, G01R21/07, G01R21/09, G01R21/12 take precedence)	G01R21/01	G01R21/01		218
G01R21/02	8	by thermal methods {, e.g. calorimetric}	G01R21/02	G01R21/02		296
G01R21/04	9	in circuits having distributed constants	G01R21/04	G01R21/04		92
G01R21/06	8	by measuring current and voltage (G01R21/08&#160;-&#160;G01R21/133 take precedence)	G01R21/06	G01R21/06		2195
G01R21/07	9	in circuits having distributed constants (G01R21/09 takes precedence)	G01R21/07	G01R21/07		60
G01R21/08	8	by using galvanomagnetic-effect devices, e.g. Hall-effect devices	G01R21/08	G01R21/08		326
G01R21/09	9	in circuits having distributed constants	G01R21/09	G01R21/09		5
G01R21/10	8	by using square-law characteristics of circuit elements, e.g. diodes, to measure power absorbed by loads of known impedance (G01R21/02 takes precedence)	G01R21/10	G01R21/10		140
G01R21/12	9	in circuits having distributed constants	G01R21/12	G01R21/12		77
G01R21/127	8	by using pulse modulation (G01R21/133 takes precedence)	G01R21/127	G01R21/127		158
G01R21/1271	9	{Measuring real or reactive component, measuring apparent energy}	G01R21/127	G01R21/127		18
G01R21/1273	10	{Measuring real component}	G01R21/127	G01R21/127		18
G01R21/1275	10	{Measuring reactive component}	G01R21/127	G01R21/127		10
G01R21/1276	10	{Measuring apparent energy}	G01R21/127	G01R21/127		1
G01R21/1278	9	{Adapted for special tariff measuring}	G01R21/127	G01R21/127		5
G01R21/133	8	by using digital technique	G01R21/133	G01R21/133		2533
G01R21/1331	9	{Measuring real or reactive component, measuring apparent energy}	G01R21/133	G01R21/133		373
G01R21/1333	9	{adapted for special tariff measuring}	G01R21/133	G01R21/133		236
G01R21/1335	10	{Tariff switching circuits}	G01R21/133	G01R21/133		42
G01R21/1336	10	{Measuring overconsumption}	G01R21/133	G01R21/133		48
G01R21/1338	10	{Measuring maximum demand}	G01R21/133	G01R21/133		90
G01R21/14	8	Compensating for temperature change	G01R21/14	G01R21/14		154
G01R22/00	7	Arrangements for measuring time integral of electric power or current, e.g. electricity meters<br><br><u>NOTE</u><br><br> An arrangement for measuring time integral of electric power is classified in group G01R21/00 if the essential characteristic is the measuring of electric power. 	G01R22/00	G01R22/00		990
G01R22/02	8	by electrolytic methods	G01R22/02	G01R22/02		409
G01R22/04	8	by calorimetric methods	G01R22/04	G01R22/04		48
G01R22/06	8	by electronic methods	G01R22/06	G01R22/06		1892
G01R22/061	9	{Details of electronic electricity meters}	G01R22/06	G01R22/06		710
G01R22/063	10	{related to remote communication}	G01R22/06	G01R22/06		2140
G01R22/065	10	{related to mechanical aspects}	G01R22/06	G01R22/06		761
G01R22/066	10	{Arrangements for avoiding or indicating fraudulent use}	G01R22/06	G01R22/06		878
G01R22/068	10	{Arrangements for indicating or signaling faults}	G01R22/06	G01R22/06		581
G01R22/08	9	using analogue techniques	G01R22/08	G01R22/08		71
G01R22/10	9	using digital techniques	G01R22/10	G01R22/10		1935
G01R23/00	7	Arrangements for measuring frequencies; Arrangements for analysing frequency spectra	G01R23/00	G01R23/00		1383
G01R23/005	8	{Circuits for comparing several input signals and for indicating the result of this comparison, e.g. equal, different, greater, smaller (comparing phase or frequency of 2 mutually independent oscillations in demodulators)}	G01R23/00	G01R23/00		545
G01R23/02	8	Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage	G01R23/02	G01R23/02		3712
G01R23/04	9	adapted for measuring in circuits having distributed constants	G01R23/04	G01R23/04		254
G01R23/06	9	by converting frequency into an amplitude of current or voltage	G01R23/06	G01R23/06		325
G01R23/07	10	using response of circuits tuned on resonance, e.g. grid-drip meter	G01R23/07	G01R23/07		105
G01R23/08	10	using response of circuits tuned off resonance	G01R23/08	G01R23/08		10
G01R23/09	10	using analogue integrators, e.g. capacitors establishing a mean value by balance of input signals and defined discharge signals or leakage	G01R23/09	G01R23/09		340
G01R23/10	9	by converting frequency into a train of pulses, which are then counted {, i.e. converting the signal into a square wave}	G01R23/10	G01R23/10		735
G01R23/12	9	by converting frequency into phase shift	G01R23/12	G01R23/12		236
G01R23/14	9	by heterodyning; by beat-frequency comparison	G01R23/14	G01R23/14		134
G01R23/145	10	{by heterodyning or by beat-frequency comparison with the harmonic of an oscillator}	G01R23/14	G01R23/14		36
G01R23/15	9	Indicating that frequency of pulses is either above or below a predetermined value or within or outside a predetermined range of values, by making use of non-linear or digital elements {(indicating that pulse width is above or below a certain limit)}	G01R23/15	G01R23/15		479
G01R23/155	10	{giving an indication of the number of times this occurs, i.e. multi-channel analysers (for pulse characteristics)}	G01R23/15	G01R23/15		28
G01R23/16	8	Spectrum analysis; Fourier analysis	G01R23/16	G01R23/16		4322
G01R23/163	9	adapted for measuring in circuits having distributed constants	G01R23/163	G01R23/163		187
G01R23/165	9	using filters	G01R23/165	G01R23/165		1188
G01R23/167	10	with digital filters	G01R23/167	G01R23/167		409
G01R23/17	9	with optical {or acoustical} auxiliary devices	G01R23/17	G01R23/17		226
G01R23/173	9	Wobbulating devices similar to swept panoramic receivers	G01R23/173	G01R23/173		111
G01R23/175	9	by delay means, e.g. tapped delay lines	G01R23/175	G01R23/175		66
G01R23/177	9	Analysis of very low frequencies	G01R23/177	G01R23/177		28
G01R23/18	9	with provision for recording frequency spectrum	G01R23/18	G01R23/18		218
G01R23/20	9	Measurement of non-linear distortion	G01R23/20	G01R23/20		683
G01R25/00	7	Arrangements for measuring phase angle between a voltage and a current or between voltages or currents	G01R25/00	G01R25/00		3138
G01R25/005	8	{Circuits for comparing several input signals and for indicating the result of this comparison, e.g. equal, different, greater, smaller, or for passing one of the input signals as output signal}	G01R25/00	G01R25/00		448
G01R25/02	8	in circuits having distributed constants	G01R25/02	G01R25/02		106
G01R25/04	8	involving adjustment of a phase shifter to produce a predetermined phase difference, e.g. zero difference	G01R25/04	G01R25/04		299
G01R25/06	8	employing quotient instrument	G01R25/06	G01R25/06		11
G01R25/08	8	by counting of standard pulses	G01R25/08	G01R25/08		156
G01R27/00	7	Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom	G01R27/00	G01R27/00		390
G01R27/02	8	Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant (by measuring phase angle only G01R25/00)<br><br><u>NOTE</u><br><br> Groups G01R27/02&#160;-&#160;G01R27/22 cover variables that directly or indirectly can be measured over two poles of a component or a Thevenin two-pole equivalent. Subgroup G01R27/26 also covers other techniques, e.g. using electro magnetic waves or network analyzers 	G01R27/02	G01R27/02		8412
G01R27/025	9	{Measuring very high resistances, e.g. isolation resistances, i.e. megohm-meters}	G01R27/02	G01R27/02		2852
G01R27/04	9	in circuits having distributed constants {, e.g. having very long conductors or involving high frequencies}	G01R27/04	G01R27/04		485
G01R27/06	10	Measuring reflection coefficients; Measuring standing-wave ratio	G01R27/06	G01R27/06		622
G01R27/08	9	Measuring resistance by measuring both voltage and current	G01R27/08	G01R27/08		3102
G01R27/10	10	using two-coil or crossed-coil instruments forming quotient	G01R27/10	G01R27/10		20
G01R27/12	11	using hand generators, e.g. meggers	G01R27/12	G01R27/12		277
G01R27/14	9	Measuring resistance by measuring current or voltage obtained from a reference source (G01R27/16, G01R27/20, G01R27/22 take precedence)	G01R27/14	G01R27/14		1089
G01R27/16	9	Measuring impedance of element or network through which a current is passing from another source, e.g. cable, power line	G01R27/16	G01R27/16		958
G01R27/18	10	Measuring resistance to earth {, i.e. line to ground}	G01R27/18	G01R27/18		1314
G01R27/20	9	Measuring earth resistance; Measuring contact resistance, {e.g.} of earth connections, e.g. plates	G01R27/20	G01R27/20		1158
G01R27/205	10	{Measuring contact resistance of connections, e.g. of earth connections}	G01R27/20	G01R27/20		687
G01R27/22	9	Measuring resistance of fluids	G01R27/22	G01R27/22		701
G01R27/26	9	Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants {; Measuring impedance or related variables}	G01R27/26	G01R27/26		1352
G01R27/2605	10	{Measuring capacitance (capacitive sensors G01D5/24)}	G01R27/26	G01R27/26		4364
G01R27/2611	10	{Measuring inductance}	G01R27/26	G01R27/26		779
G01R27/2617	10	{Measuring dielectric properties, e.g. constants (testing dielectric strength G01R31/12; detecting insulation faults G01R31/52; G01R27/2688 takes precedence)}	G01R27/26	G01R27/26		662
G01R27/2623	11	{Measuring-systems or electronic circuits (G01R27/2635, G01R27/2682 take precedence)}	G01R27/26	G01R27/26		432
G01R27/2629	12	{Bridge circuits (bridges for measuring loss angle G01R27/2694)}	G01R27/26	G01R27/26		31
G01R27/2635	11	{Sample holders, electrodes or excitation arrangements, e.g. sensors or measuring cells}	G01R27/26	G01R27/26		201
G01R27/2641	12	{of plate type, i.e. with the sample sandwiched in the middle}	G01R27/26	G01R27/26		68
G01R27/2647	12	{of coaxial or concentric type, e.g. with the sample in a coaxial line}	G01R27/26	G01R27/26		55
G01R27/2652	13	{open-ended type, e.g. abutting against the sample}	G01R27/26	G01R27/26		27
G01R27/2658	12	{Cavities, resonators, free space arrangements, reflexion or interference arrangements (G01R27/2647 takes precedence; optical methods G01R27/2682)}	G01R27/26	G01R27/26		99
G01R27/2664	13	{Transmission line, wave guide (closed or open-ended) or strip - or microstrip line arrangements}	G01R27/26	G01R27/26		65
G01R27/267	12	{Coils or antennae arrangements, e.g. coils surrounding the sample or transmitter/receiver antennae}	G01R27/26	G01R27/26		68
G01R27/2676	12	{Probes}	G01R27/26	G01R27/26		62
G01R27/2682	11	{using optical methods or electron beams}	G01R27/26	G01R27/26		59
G01R27/2688	10	{Measuring quality factor or dielectric loss, e.g. loss angle, or power factor (power factor related to power measurements G01R21/006; testing capacitors G01R31/016)}	G01R27/26	G01R27/26		355
G01R27/2694	11	{Measuring dielectric loss, e.g. loss angle, loss factor or power factor}	G01R27/26	G01R27/26		910
G01R27/28	8	Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response (in line transmission systems H04B3/46)	G01R27/28	G01R27/28		1446
G01R27/30	9	with provision for recording characteristics, e.g. by plotting Nyquist diagram	G01R27/30	G01R27/30		66
G01R27/32	9	in circuits having distributed constants {, e.g. having very long conductors or involving high frequencies}	G01R27/32	G01R27/32		921
G01R29/00	7	Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00&#160;-&#160;G01R27/00	G01R29/00	G01R29/00		411
G01R29/02	8	Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration	G01R29/02	G01R29/02		871
G01R29/023	9	{Measuring pulse width}	G01R29/02	G01R29/02		250
G01R29/027	9	Indicating that a pulse characteristic is either above or below a predetermined value or within or beyond a predetermined range of values	G01R29/027	G01R29/027		260
G01R29/0273	10	{the pulse characteristic being duration, i.e. width (indicating that frequency of pulses is above or below a certain limit)}	G01R29/027	G01R29/027		539
G01R29/0276	10	{the pulse characteristic being rise time (measuring rate of change G01R19/12)}	G01R29/027	G01R29/027		65
G01R29/033	10	giving an indication of the number of times this occurs {, i.e. multi-channel analysers (the characteristic being frequency)}	G01R29/033	G01R29/033		80
G01R29/04	8	Measuring form factor, i.e. quotient of root-mean-square value and arithmetic mean of instantaneous value; Measuring peak factor, i.e. quotient of maximum value and root-mean-square value	G01R29/04	G01R29/04		74
G01R29/06	8	Measuring depth of modulation	G01R29/06	G01R29/06		407
G01R29/08	8	Measuring electromagnetic field characteristics	G01R29/08	G01R29/08		1489
G01R29/0807	9	{characterised by the application}	G01R29/08	G01R29/08		72
G01R29/0814	10	{Field measurements related to measuring influence on or from apparatus, components or humans (EMC, EMI and similar testing in general G01R31/001), e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning}	G01R29/08	G01R29/08		1222
G01R29/0821	11	{rooms and test sites therefor, e.g. anechoic chambers, open field sites or TEM cells (for testing antennas G01R29/105)}	G01R29/08	G01R29/08		673
G01R29/0828	12	{TEM-cells}	G01R29/08	G01R29/08		106
G01R29/0835	11	{Testing shielding, e.g. for efficiency}	G01R29/08	G01R29/08		389
G01R29/0842	11	{Measurements related to lightning, e.g. measuring electric disturbances, warning systems}	G01R29/08	G01R29/08		576
G01R29/085	11	{for detecting presence or location of electric lines or cables (fault detection G01R31/50; fault location G01R31/08)}	G01R29/08	G01R29/08		174
G01R29/0857	11	{Dosimetry, i.e. measuring the time integral of radiation intensity; Level warning devices for personal safety use (nuclear radiation dosimetry G01T)}	G01R29/08	G01R29/08		497
G01R29/0864	9	{characterised by constructional or functional features}	G01R29/08	G01R29/08		79
G01R29/0871	10	{Complete apparatus or systems; circuits, e.g. receivers or amplifiers (G01R29/0878, G01R29/0892 take precedence; dosimeters, warning devices G01R29/0857)}	G01R29/08	G01R29/08		1847
G01R29/0878	10	{Sensors; antennas; probes; detectors (wave guide measuring sections G01R1/24)}	G01R29/08	G01R29/08		1719
G01R29/0885	11	{using optical probes, e.g. electro-optical, luminescent, glow discharge, or optical interferometers}	G01R29/08	G01R29/08		463
G01R29/0892	10	{Details related to signal analysis or treatment; presenting results, e.g. displays; measuring specific signal features other than field strength, e.g. polarisation, field modes, phase, envelope, maximum value}	G01R29/08	G01R29/08		1551
G01R29/10	9	Radiation diagrams of antennas	G01R29/10	G01R29/10		2658
G01R29/105	10	{using anechoic chambers; Chambers or open field sites used therefor (test sites used for measuring on other objects than aerials G01R29/0828; wave absorbing devices H01Q17/00)}	G01R29/10	G01R29/10		524
G01R29/12	8	Measuring electrostatic fields {or voltage-potential}	G01R29/12	G01R29/12		2083
G01R29/14	9	Measuring field distribution	G01R29/14	G01R29/14		501
G01R29/16	8	Measuring asymmetry of polyphase networks	G01R29/16	G01R29/16		988
G01R29/18	8	Indicating phase sequence; Indicating synchronism	G01R29/18	G01R29/18		1213
G01R29/20	8	Measuring number of turns; Measuring transformation ratio or coupling factor of windings	G01R29/20	G01R29/20		253
G01R29/22	8	Measuring piezoelectric properties	G01R29/22	G01R29/22		333
G01R29/24	8	Arrangements for measuring quantities of charge	G01R29/24	G01R29/24		1337
G01R29/26	8	Measuring noise figure; Measuring signal-to-noise ratio	G01R29/26	G01R29/26		1396
G01R31/00	7	Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere ({measuring superconductive properties G01R33/1238;} testing line transmission systems H04B3/46; testing or measuring semiconductors or solid state devices during manufacture {H10P74/00})<br><br><u>NOTE</u><br><br>Groups G01R31/08, G01R31/12, G01R31/327, G01R31/24, G01R31/26, G01R31/34, G01R31/36, G01R31/40, G01R31/44 take precedence over group G01R31/50.	G01R31/00	G01R31/00		26021
G01R31/001	8	{Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing (measuring electromagnetic fields G01R29/08; circuits for generating HV pulses in dielectric strength testing G01R31/14)}	G01R31/00	G01R31/00		2921
G01R31/002	9	{where the device under test is an electronic circuit}	G01R31/00	G01R31/00		768
G01R31/003	8	{Environmental or reliability tests (of individual semiconductors G01R31/2642; of PCB&apos;s G01R31/2817; of IC&apos;s G01R31/2855; of other circuits G01R31/2849)}	G01R31/00	G01R31/00		5153
G01R31/005	8	{Testing of electric installations on transport means}	G01R31/00	G01R31/00		455
G01R31/006	9	{on road vehicles, e.g. automobiles or trucks (testing of ignition installations peculiar to internal combustion engines F02P17/00)}	G01R31/00	G01R31/00		4960
G01R31/007	10	{using microprocessors or computers}	G01R31/00	G01R31/00		2219
G01R31/008	9	{on air- or spacecraft, railway rolling stock or sea-going vessels}	G01R31/00	G01R31/00		1672
G01R31/01	8	Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station (testing of cables continuously passing the testing apparatus G01R31/59; testing dielectric strength or breakdown voltage G01R31/12)	G01R31/01	G01R31/01		1916
G01R31/013	9	{Testing passive components (testing relays G01R31/3278; testing electrical windings, e.g. inductors G01R31/72)}	G01R31/01	G01R31/01		285
G01R31/016	10	{Testing of capacitors (measuring capacitance G01R27/2605)}	G01R31/01	G01R31/01		404
G01R31/08	8	Locating faults in cables, transmission lines, or networks	G01R31/08	G01R31/08		3605
G01R31/081	9	{according to type of conductors}	G01R31/08	G01R31/08		168
G01R31/083	10	{in cables, e.g. underground}	G01R31/08	G01R31/08		3292
G01R31/085	10	{in power transmission or distribution lines, e.g. overhead}	G01R31/08	G01R31/08		5078
G01R31/086	10	{in power transmission or distribution networks, i.e. with interconnected conductors}	G01R31/08	G01R31/08		8028
G01R31/088	9	{Aspects of digital computing}	G01R31/08	G01R31/08		8784
G01R31/10	9	by increasing destruction at fault, e.g. burning-in by using a pulse generator operating a special program	G01R31/10	G01R31/10		78
G01R31/11	9	using pulse reflection methods	G01R31/11	G01R31/11		1293
G01R31/12	8	Testing dielectric strength or breakdown voltage {; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing (G01R31/08, G01R31/327 and G01R31/72 take precedence; measuring in plasmas G01R19/0061; measuring dielectric constants G01R27/2617; ESD, EMC or EMP testing of circuits G01R31/002)}	G01R31/12	G01R31/12		5664
G01R31/1209	9	{using acoustic measurements (acoustic measurements G01H3/00)}	G01R31/12	G01R31/12		2015
G01R31/1218	9	{using optical methods; using charged particle, e.g. electron, beams or X-rays}	G01R31/12	G01R31/12		2016
G01R31/1227	9	{of components, parts or materials (G01R31/1209, G01R31/1218, G01R31/18 take precedence; circuits therefor G01R31/14; testing vessels of electrodes G01R31/16)}	G01R31/12	G01R31/12		5162
G01R31/1236	10	{of surge arresters (monitoring overvoltage diverters or arresters H02H3/048)}	G01R31/12	G01R31/12		236
G01R31/1245	10	{of line insulators or spacers, e.g. ceramic overhead line cap insulators; of insulators in HV bushings}	G01R31/12	G01R31/12		1232
G01R31/1254	10	{of gas-insulated power appliances or vacuum gaps (testing switches G01R31/327; detecting electrical or mechanical defects in encased switchgear H02B13/065)}	G01R31/12	G01R31/12		1130
G01R31/1263	10	{of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation}	G01R31/12	G01R31/12		1785
G01R31/1272	11	{of cable, line or wire insulation, e.g. using partial discharge measurements (locating faults in cables G01R31/083)}	G01R31/12	G01R31/12		4604
G01R31/1281	11	{of liquids or gases}	G01R31/12	G01R31/12		677
G01R31/129	11	{of components or parts made of semiconducting materials; of LV components or parts (G01R31/18 takes precedence)}	G01R31/12	G01R31/12		300
G01R31/14	9	Circuits therefor {, e.g. for generating test voltages, sensing circuits (G01R31/1209&#160;-&#160;G01R31/1227 take precedence; for testing switches G01R31/327)}	G01R31/14	G01R31/14		2162
G01R31/16	9	Construction of testing vessels; Electrodes therefor	G01R31/16	G01R31/16		681
G01R31/18	9	Subjecting similar articles in turn to test, e.g. go/no-go tests in mass production	G01R31/18	G01R31/18		271
G01R31/20	9	Preparation of articles or specimens to facilitate testing	G01R31/20	G01R31/20		330
G01R31/24	8	Testing of discharge tubes (during manufacture H01J9/42)	G01R31/24	G01R31/24		80
G01R31/245	9	{Testing of gas discharge tubes}	G01R31/24	G01R31/24		132
G01R31/25	9	Testing of vacuum tubes	G01R31/25	G01R31/25		343
G01R31/252	10	{Testing of electron multipliers, e.g. photo-multipliers}	G01R31/25	G01R31/25		15
G01R31/255	10	{Testing of transit-time tubes, e.g. klystrons, magnetrons}	G01R31/25	G01R31/25		26
G01R31/257	10	{Testing of beam-tubes, e.g. cathode-ray tubes, image pick-up tubes (of channel image intensifier arrays G01R31/252; of transit time tubes G01R31/255)}	G01R31/25	G01R31/25		80
G01R31/26	8	Testing of individual semiconductor devices (testing of photovoltaic devices H02S50/10; testing or measuring during manufacture or treatment {H10P74/00})	G01R31/26	G01R31/26		2592
G01R31/2601	9	{Apparatus or methods therefor (G01R31/2607, G01R31/2642 take precedence)}	G01R31/26	G01R31/26		6510
G01R31/2603	10	{for curve tracing of semiconductor characteristics, e.g. on oscilloscope}	G01R31/26	G01R31/26		311
G01R31/2607	9	{Circuits therefor (G01R31/2642 takes precedence)}	G01R31/26	G01R31/26		739
G01R31/2608	10	{for testing bipolar transistors}	G01R31/26	G01R31/26		841
G01R31/261	11	{for measuring break-down voltage or punch through voltage therefor}	G01R31/26	G01R31/26		99
G01R31/2612	11	{for measuring frequency response characteristics, e.g. cut-off frequency thereof}	G01R31/26	G01R31/26		39
G01R31/2614	11	{for measuring gain factor thereof}	G01R31/26	G01R31/26		59
G01R31/2616	11	{for measuring noise (measuring noise factor in general G01R29/26)}	G01R31/26	G01R31/26		19
G01R31/2617	11	{for measuring switching properties thereof}	G01R31/26	G01R31/26		160
G01R31/2619	11	{for measuring thermal properties thereof}	G01R31/26	G01R31/26		339
G01R31/2621	10	{for testing field effect transistors, i.e. FET&apos;s}	G01R31/26	G01R31/26		1424
G01R31/2623	11	{for measuring break-down voltage therefor}	G01R31/26	G01R31/26		137
G01R31/2625	11	{for measuring gain factor thereof}	G01R31/26	G01R31/26		15
G01R31/2626	11	{for measuring noise (measuring noise factor in general G01R29/26)}	G01R31/26	G01R31/26		37
G01R31/2628	11	{for measuring thermal properties thereof}	G01R31/26	G01R31/26		246
G01R31/263	10	{for testing thyristors}	G01R31/26	G01R31/26		340
G01R31/2632	10	{for testing diodes}	G01R31/26	G01R31/26		620
G01R31/2633	11	{for measuring switching properties thereof}	G01R31/26	G01R31/26		59
G01R31/2635	11	{Testing light-emitting diodes, laser diodes or photodiodes}	G01R31/26	G01R31/26		1515
G01R31/2637	10	{for testing other individual devices (G01R31/2608&#160;-&#160;G01R31/2632, G01R31/27 take precedence)}	G01R31/26	G01R31/26		397
G01R31/2639	11	{for testing field-effect devices, e.g. of MOS-capacitors (G01R31/2621 takes precedence)}	G01R31/26	G01R31/26		113
G01R31/2641	10	{for testing charge coupled devices}	G01R31/26	G01R31/26		37
G01R31/2642	9	{Testing semiconductor operation lifetime or reliability, e.g. by accelerated life tests}	G01R31/26	G01R31/26		1627
G01R31/2644	9	{Adaptations of individual semiconductor devices to facilitate the testing thereof}	G01R31/26	G01R31/26		318
G01R31/2646	9	{for measuring noise (G01R31/2616, G01R31/2626 take precedence)}	G01R31/26	G01R31/26		69
G01R31/2648	9	{Characterising semiconductor materials (testing of materials or semi-finished products G01R31/2831; testing during manufacture H10P74/00)}	G01R31/26	G01R31/26		545
G01R31/265	9	Contactless testing {(of circuits, also in wafer-form G01R31/302)}	G01R31/265	G01R31/265		172
G01R31/2653	10	{using electron beams}	G01R31/265	G01R31/265		115
G01R31/2656	10	{using non-ionising electromagnetic radiation, e.g. optical radiation}	G01R31/265	G01R31/265		571
G01R31/27	9	Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements {(testing printed circuit boards G01R31/2801)}	G01R31/27	G01R31/27		343
G01R31/275	10	{for testing individual semiconductor components within integrated circuits}	G01R31/27	G01R31/27		285
G01R31/28	8	Testing of electronic circuits, e.g. by signal tracer ({EMC, EMP or similar testing of electronic circuits G01R31/002;} testing for short-circuits, discontinuities, leakage or incorrect line connection G01R31/50; checking computers {or computer components}G06F11/00; checking static stores for correct operation G11C29/00{; testing receivers or transmitters of transmission systems H04B17/00})	G01R31/28	G01R31/28		3201
G01R31/2801	9	{Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] (G01R31/318508 takes precedence; contactless testing G01R31/302; testing contacts or connections G01R31/66)}	G01R31/28	G01R31/28		1064
G01R31/2803	10	{by means of functional tests, e.g. logic-circuit-simulation or algorithms therefor (testing electronic digital computers G06F11/00)}	G01R31/28	G01R31/28		394
G01R31/2805	10	{Bare printed circuit boards}	G01R31/28	G01R31/28		500
G01R31/2806	10	{Apparatus therefor, e.g. test stations, drivers, analysers, conveyors (G01R31/2805, G01R31/281, G01R31/2818 take precedence)}	G01R31/28	G01R31/28		1864
G01R31/2808	11	{Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards (probe, multiprobe, probe manipulator or probe fixture G01R1/067)}	G01R31/28	G01R31/28		2872
G01R31/281	10	{Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing (G01R31/2818 takes precedence)}	G01R31/28	G01R31/28		676
G01R31/2812	11	{Checking for open circuits or shorts, e.g. solder bridges; Testing conductivity, resistivity or impedance (of connections G01R31/66)}	G01R31/28	G01R31/28		1007
G01R31/2813	11	{Checking the presence, location, orientation or value, e.g. resistance, of components or conductors (orientation of the DUT with respect to the test fixture G01R1/06705)}	G01R31/28	G01R31/28		367
G01R31/2815	11	{Functional tests, e.g. boundary scans, using the normal I/O contacts (contacting devices G01R31/2808; testing digital circuits G01R31/317, G06F11/00)}	G01R31/28	G01R31/28		415
G01R31/2817	11	{Environmental-, stress-, or burn-in tests (of IC&apos;s G01R31/2855; of individual semiconductors G01R31/2642; of other circuits G01R31/2849)}	G01R31/28	G01R31/28		580
G01R31/2818	10	{using test structures on, or modifications of, the card under test, made for the purpose of testing, e.g. additional components or connectors (G01R31/2805 takes precedence; printed circuits having, e.g. symbols, test patterns or visualisation means H05K1/0266)}	G01R31/28	G01R31/28		715
G01R31/282	9	{Testing of electronic circuits specially adapted for particular applications not provided for elsewhere (G01R31/2801 and G01R31/2851 take precedence)}<br><br><u>NOTE</u><br><br>References listed below indicate CPC places which could also be of interest when carrying out a search in respect of the subject matter covered by the preceding group: <br>testing of individual LEDs G01R31/2635<br>testing of lamps G01R31/44<br>testing of displays and display drivers, e.g. LCDs G09G3/006<br>testing of ADCs or DACs H03M1/1071.	G01R31/28	G01R31/28		1411
G01R31/2822	10	{of microwave or radiofrequency circuits (of attenuation, gain, e.g. using network analyzers G01R27/28)}	G01R31/28	G01R31/28		1176
G01R31/2824	11	{testing of oscillators or resonators}	G01R31/28	G01R31/28		200
G01R31/2825	10	{in household appliances or professional audio/video equipment (testing LAN&apos;s H04L43/50; testing TV systems H04N17/00; testing loudspeakers H04R29/00)}	G01R31/28	G01R31/28		1147
G01R31/2827	10	{Testing of electronic protection circuits (testing switches G01R31/327; checking alarm systems G08B29/00; self test of summation current transformers H02H3/335)}	G01R31/28	G01R31/28		311
G01R31/2829	10	{Testing of circuits in sensor or actuator systems (testing of apparatus for measuring electric or magnetic variables G01R35/00; testing of indicating or recording apparatus G01D; in airbag systems B60R21/0173; checking gas analysers G01N33/007; monitoring or fail-safe circuits for electromagnets H01F7/1844)}	G01R31/28	G01R31/28		1293
G01R31/2831	10	{Testing of materials or semi-finished products, e.g. semiconductor wafers or substrates (G01R31/318511 takes precedence; testing during manufacture H10P74/00)}	G01R31/28	G01R31/28		1506
G01R31/2832	9	{Specific tests of electronic circuits not provided for elsewhere (G01R31/2801, G01R31/316 take precedence)}	G01R31/28	G01R31/28		310
G01R31/2834	10	{Automated test systems [ATE]; using microprocessors or computers (G01R31/317 takes precedence; ATE for detection of defective computer hardware G06F11/2736)}	G01R31/28	G01R31/28		2297
G01R31/2836	10	{Fault-finding or characterising (G01R31/2822&#160;-&#160;G01R31/2831 take precedence)}	G01R31/28	G01R31/28		866
G01R31/2837	11	{Characterising or performance testing, e.g. of frequency response (transient response G01R27/28)}	G01R31/28	G01R31/28		620
G01R31/2839	11	{using signal generators, power supplies or circuit analysers (G01R31/2879 takes precedence; multimeters G01R15/12, network analysers G01R27/28)}	G01R31/28	G01R31/28		390
G01R31/2841	12	{Signal generators}	G01R31/28	G01R31/28		404
G01R31/2843	11	{In-circuit-testing}	G01R31/28	G01R31/28		641
G01R31/2844	11	{using test interfaces, e.g. adapters, test boxes, switches, PIN drivers (G01R31/2889 takes precedence)}	G01R31/28	G01R31/28		547
G01R31/2846	11	{using hard- or software simulation or using knowledge-based systems, e.g. expert systems, artificial intelligence or interactive algorithms}	G01R31/28	G01R31/28		426
G01R31/2848	12	{using simulation}	G01R31/28	G01R31/28		301
G01R31/2849	11	{Environmental or reliability testing, e.g. burn-in or validation tests (of individual semiconductors G01R31/2642; of printed circuits boards G01R31/2817; of IC&apos;s G01R31/2855)}	G01R31/28	G01R31/28		548
G01R31/2851	9	{Testing of integrated circuits [IC] (G01R31/317 takes precedence; testing individual devices G01R31/26; testing printed circuits G01R31/2801)}	G01R31/28	G01R31/28		3696
G01R31/2853	10	{Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections (G01R31/31717 takes precedence; test of chip-to-PCB or lead-to-PCB connections G01R31/66)}	G01R31/28	G01R31/28		1230
G01R31/2855	10	{Environmental, reliability or burn-in testing}	G01R31/28	G01R31/28		558
G01R31/2856	11	{Internal circuit aspects, e.g. built-in test features; Test chips; Measuring material aspects, e.g. electro migration [EM]}	G01R31/28	G01R31/28		1267
G01R31/2858	12	{Measuring of material aspects, e.g. electro-migration [EM], hot carrier injection}	G01R31/28	G01R31/28		262
G01R31/286	11	{External aspects, e.g. related to chambers, contacting devices or handlers}	G01R31/28	G01R31/28		186
G01R31/2862	12	{Chambers or ovens; Tanks}	G01R31/28	G01R31/28		779
G01R31/2863	12	{Contacting devices, e.g. sockets, burn-in boards or mounting fixtures (in general G01R1/04)}	G01R31/28	G01R31/28		2823
G01R31/2865	12	{Holding devices, e.g. chucks; Handlers or transport devices (having contacts G01R31/2863)}	G01R31/28	G01R31/28		821
G01R31/2867	13	{Handlers or transport devices, e.g. loaders, carriers, trays}	G01R31/28	G01R31/28		2172
G01R31/2868	12	{Complete testing stations; systems; procedures; software aspects}	G01R31/28	G01R31/28		647
G01R31/287	13	{Procedures; Software aspects}	G01R31/28	G01R31/28		437
G01R31/2872	11	{related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation}	G01R31/28	G01R31/28		231
G01R31/2874	12	{related to temperature}	G01R31/28	G01R31/28		1540
G01R31/2875	13	{related to heating}	G01R31/28	G01R31/28		890
G01R31/2877	13	{related to cooling}	G01R31/28	G01R31/28		629
G01R31/2879	12	{related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads}	G01R31/28	G01R31/28		1308
G01R31/2881	12	{related to environmental aspects other than temperature, e.g. humidity or vibrations}	G01R31/28	G01R31/28		364
G01R31/2882	10	{Testing timing characteristics}	G01R31/28	G01R31/28		410
G01R31/2884	10	{using dedicated test connectors, test elements or test circuits on the IC under test (G01R31/2855 takes precedence)}	G01R31/28	G01R31/28		2708
G01R31/2886	10	{Features relating to contacting the IC under test, e.g. probe heads; chucks (G01R31/2865 takes precedence, test connections, e.g. test sockets, or probes per se, G01R1/04 or G01R1/06)}	G01R31/28	G01R31/28		3765
G01R31/2887	11	{involving moving the probe head or the IC under test; docking stations (moving single probes G01R1/06705; moving individual probes in multiple probes G01R1/07392)}	G01R31/28	G01R31/28		1895
G01R31/2889	11	{Interfaces, e.g. between probe and tester (G01R31/31905 and G01R1/07364 take precedence)}	G01R31/28	G01R31/28		1873
G01R31/2891	11	{related to sensing or controlling of force, position, temperature (G01R31/2874 takes precedence; sensing of force G01L; sensing of position G01B, G01D; sensing of temperature G01K; controlling in general G05)}	G01R31/28	G01R31/28		1683
G01R31/2893	10	{Handling, conveying or loading, e.g. belts, boats, vacuum fingers (G01R31/2867 takes precedence; handling semiconductor devices or wafers during manufacture or treatment H10P72/00)}	G01R31/28	G01R31/28		2838
G01R31/2894	10	{Aspects of quality control [QC] (G01R31/31718 takes precedence; program control for QC G05B19/41875)}	G01R31/28	G01R31/28		856
G01R31/2896	10	{Testing of IC packages; Test features related to IC packages (containers per seH10W76/10, encapsulations per seH10W74/00)}	G01R31/28	G01R31/28		1519
G01R31/2898	10	{Sample preparation, e.g. removing encapsulation, etching (sample preparation in general G01N1/00)}	G01R31/28	G01R31/28		236
G01R31/30	9	Marginal testing, e.g. by varying supply voltage (testing computers during standby operation or idle time G06F11/22)	G01R31/30	G01R31/30		437
G01R31/3004	10	{Current or voltage test}	G01R31/30	G01R31/30		830
G01R31/3008	11	{Quiescent current [IDDQ] test or leakage current test}	G01R31/30	G01R31/30		316
G01R31/3012	11	{Built-In-Current test [BIC]}	G01R31/30	G01R31/30		35
G01R31/3016	10	{Delay or race condition test, e.g. race hazard test}	G01R31/30	G01R31/30		504
G01R31/302	9	Contactless testing {(G01R31/66 takes precedence)}	G01R31/302	G01R31/302		270
G01R31/3025	10	{Wireless interface with the DUT}	G01R31/302	G01R31/302		326
G01R31/303	10	of integrated circuits (G01R31/305&#160;-&#160;G01R31/315 take precedence)	G01R31/303	G01R31/303		280
G01R31/304	10	of printed or hybrid circuits (G01R31/305&#160;-&#160;G01R31/315 take precedence)	G01R31/304	G01R31/304		121
G01R31/305	10	using electron beams {(investigating or analysing materials by measuring photoelectric effect G01N23/227)}	G01R31/305	G01R31/305		379
G01R31/306	11	of printed or hybrid circuits	G01R31/306	G01R31/306		46
G01R31/307	11	of integrated circuits	G01R31/307	G01R31/307		449
G01R31/308	10	using non-ionising electromagnetic radiation, e.g. optical radiation {(investigating or analysing materials by the use of optical means G01N21/00; image analysis G06T7/00)}	G01R31/308	G01R31/308		656
G01R31/309	11	of printed or hybrid circuits {or circuit substrates}	G01R31/309	G01R31/309		388
G01R31/311	11	of integrated circuits {(G01R31/31728 takes precedence)}	G01R31/311	G01R31/311		993
G01R31/312	10	by capacitive methods	G01R31/312	G01R31/312		243
G01R31/315	10	by inductive methods	G01R31/315	G01R31/315		144
G01R31/316	9	Testing of analog circuits {(G01R31/2851 takes precedence)}	G01R31/316	G01R31/316		588
G01R31/3161	10	Marginal testing	G01R31/3161	G01R31/3161		61
G01R31/3163	10	Functional testing	G01R31/3163	G01R31/3163		99
G01R31/3167	9	Testing of combined analog and digital circuits {(testing ADC&apos;s H03M1/1071)}	G01R31/3167	G01R31/3167		475
G01R31/317	9	Testing of digital circuits<br><br><u>WARNING</u><br>The following subgroups of G01R31/317 are not complete due to an ongoing reorganisation : G01R31/31702, G01R31/31708, G01R31/31711, G01R31/31717, G01R31/31718, G01R31/31728, G01R31/31901. See also G01R31/317 and its other subgroups	G01R31/317	G01R31/317		564
G01R31/31701	10	{Arrangements for setting the Unit Under Test [UUT] in a test mode}	G01R31/317	G01R31/317		593
G01R31/31702	10	{Testing digital circuits including elements other than semiconductor transistors, e.g. biochips, nanofabrics, mems, chips with magnetic elements}	G01R31/317	G01R31/317		126
G01R31/31703	10	{Comparison aspects, e.g. signature analysis, comparators (concerning scan tests G01R31/318566; concerning testers G01R31/3193)}	G01R31/317	G01R31/317		513
G01R31/31704	10	{Design for test; Design verification (concerning scan tests G01R31/318583; computer-aided design G06F30/00)}	G01R31/317	G01R31/317		418
G01R31/31705	10	{Debugging aspects, e.g. using test circuits for debugging, using dedicated debugging test circuits (generation of test sequences therefor G01R31/31835, using scan test therefor G01R31/318544)}	G01R31/317	G01R31/317		497
G01R31/31706	10	{involving differential digital signals, e.g. testing differential signal circuits, using differential signals for testing}	G01R31/317	G01R31/317		59
G01R31/31707	10	{Test strategies (methods for generation of test sequences G01R31/318371)}	G01R31/317	G01R31/317		293
G01R31/31708	10	{Analysis of signal quality (G01R31/31901 takes precedence; measuring frequencies or analysing frequency spectra per seG01R23/00; measuring non-linear distortion per seG01R23/20)}	G01R31/317	G01R31/317		230
G01R31/31709	11	{Jitter measurements; Jitter generators (measuring jitter, noise figure or signal-to-noise ratio per seG01R29/26; analysis of tester signals G01R31/31901)}	G01R31/317	G01R31/317		474
G01R31/3171	11	{BER [Bit Error Rate] test}	G01R31/317	G01R31/317		192
G01R31/31711	11	{Evaluation methods, e.g. shmoo plots}	G01R31/317	G01R31/317		91
G01R31/31712	10	{Input or output aspects}	G01R31/317	G01R31/317		218
G01R31/31713	11	{Input or output interfaces for test, e.g. test pins, buffers (for scan test G01R31/318572)}	G01R31/317	G01R31/317		530
G01R31/31715	11	{Testing of input or output circuits; test of circuitry between the I/C pins and the functional core, e.g. testing of input or output driver, receiver, buffer}	G01R31/317	G01R31/317		497
G01R31/31716	11	{Testing of input or output with loop-back}	G01R31/317	G01R31/317		234
G01R31/31717	11	{Interconnect testing (by scan techniques seeG01R31/31855)}	G01R31/317	G01R31/317		187
G01R31/31718	10	{Logistic aspects, e.g. binning, selection, sorting of devices under test, tester/handler interaction networks, Test management software, e.g. software for test statistics or test evaluation, yield analysis (mechanical aspects G01R31/2808, G01R31/2851)}	G01R31/317	G01R31/317		371
G01R31/31719	10	{Security aspects, e.g. preventing unauthorised access during test}	G01R31/317	G01R31/317		295
G01R31/3172	10	{Optimisation aspects, e.g. using functional pin as test pin, pin multiplexing}	G01R31/317	G01R31/317		219
G01R31/31721	10	{Power aspects, e.g. power supplies for test circuits, power saving during test (for scan test G01R31/318575)}	G01R31/317	G01R31/317		518
G01R31/31722	10	{Addressing or selecting of test units, e.g. transmission protocols for selecting test units (for scan test G01R31/318558)}	G01R31/317	G01R31/317		130
G01R31/31723	10	{Hardware for routing the test signal within the device under test to the circuits to be tested, e.g. multiplexer for multiple core testing, accessing internal nodes (routing the test signal to or from the device under test G01R31/31926)}	G01R31/317	G01R31/317		412
G01R31/31724	10	{Test controller, e.g. BIST state machine (for scan test G01R31/318555)}	G01R31/317	G01R31/317		476
G01R31/31725	10	{Timing aspects, e.g. clock distribution, skew, propagation delay (for tester hardware G01R31/31937)}	G01R31/317	G01R31/317		1047
G01R31/31726	11	{Synchronization, e.g. of test, clock or strobe signals; Signals in different clock domains; Generation of Vernier signals; Comparison and adjustment of the signals}	G01R31/317	G01R31/317		295
G01R31/31727	10	{Clock circuits aspects, e.g. test clock circuit details, timing aspects for signal generation, circuits for testing clocks (G01R31/31725 takes precedence; concerning scan test G01R31/318552, for tester hardware G01R31/31922)}	G01R31/317	G01R31/317		830
G01R31/31728	10	{Optical aspects, e.g. opto-electronics used for testing, optical signal transmission for testing electronic circuits, electro-optic components to be tested in combination with electronic circuits, measuring light emission of digital circuits (probes having electro-optic elements G01R1/071; electro-optic sampling for oscilloscopes G01R13/347; contactless testing of individual semiconductor devices by optical means G01R31/2656)}	G01R31/317	G01R31/317		106
G01R31/3173	10	Marginal testing	G01R31/3173	G01R31/3173		67
G01R31/3177	10	Testing of logic operation, e.g. by logic analysers	G01R31/3177	G01R31/3177		1422
G01R31/3181	10	Functional testing (G01R31/3177 takes precedence)	G01R31/3181	G01R31/3181		310
G01R31/31813	11	{Test pattern generators}	G01R31/3181	G01R31/3181		469
G01R31/31816	11	{Soft error testing; Soft error rate evaluation; Single event testing}	G01R31/3181	G01R31/3181		160
G01R31/3183	11	Generation of test inputs, e.g. test vectors, patterns or sequences	G01R31/3183	G01R31/3183		783
G01R31/318307	12	{computer-aided, e.g. automatic test program generator [ATPG], program translations, test program debugging}	G01R31/3183	G01R31/3183		538
G01R31/318314	12	{Tools, e.g. program interfaces, test suite, test bench, simulation hardware, test compiler, test program languages (simulation software G01R31/318357; emulators G06F11/261)}	G01R31/3183	G01R31/3183		388
G01R31/318321	12	{for combinational circuits}	G01R31/3183	G01R31/3183		39
G01R31/318328	12	{for delay tests}	G01R31/3183	G01R31/3183		154
G01R31/318335	12	{Test pattern compression or decompression (compression or decompression of scan patterns G01R31/318547; compression or decompression hardware G01R31/31921)}	G01R31/3183	G01R31/3183		143
G01R31/318342	12	{by preliminary fault modelling, e.g. analysis, simulation}	G01R31/3183	G01R31/3183		372
G01R31/31835	13	{Analysis of test coverage or failure detectability}	G01R31/3183	G01R31/3183		241
G01R31/318357	13	{Simulation (computer simulation of digital circuits G06F30/3308)}	G01R31/3183	G01R31/3183		434
G01R31/318364	12	{as a result of hardware simulation, e.g. in an HDL environment (computer-aided simulation of circuits G06F30/3308)}	G01R31/3183	G01R31/3183		176
G01R31/318371	12	{Methodologies therefor, e.g. algorithms, procedures}	G01R31/3183	G01R31/3183		297
G01R31/318378	12	{of patterns for devices arranged in a network}	G01R31/3183	G01R31/3183		40
G01R31/318385	12	{Random or pseudo-random test pattern}	G01R31/3183	G01R31/3183		258
G01R31/318392	12	{for sequential circuits (G01R31/318544 takes precedence)}	G01R31/3183	G01R31/3183		81
G01R31/3185	11	Reconfiguring for testing, e.g. LSSD, partitioning	G01R31/3185	G01R31/3185		251
G01R31/318502	12	{Test of Combinational circuits}	G01R31/3185	G01R31/3185		94
G01R31/318505	12	{Test of Modular systems, e.g. Wafers, MCM&apos;s}	G01R31/3185	G01R31/3185		396
G01R31/318508	13	{Board Level Test, e.g. P1500 Standard (features related to boundary scan G01R31/318533)}	G01R31/3185	G01R31/3185		72
G01R31/318511	13	{Wafer Test}	G01R31/3185	G01R31/3185		337
G01R31/318513	13	{Test of Multi-Chip-Moduls}	G01R31/3185	G01R31/3185		296
G01R31/318516	12	{Test of programmable logic devices [PLDs]}	G01R31/3185	G01R31/3185		413
G01R31/318519	13	{Test of field programmable gate arrays [FPGA]}	G01R31/3185	G01R31/3185		368
G01R31/318522	12	{Test of Sequential circuits (test of microprocessors G06F11/2236, test of ALU&apos;s G06F11/2226)}	G01R31/3185	G01R31/3185		59
G01R31/318525	13	{Test of flip-flops or latches}	G01R31/3185	G01R31/3185		129
G01R31/318527	13	{Test of counters}	G01R31/3185	G01R31/3185		81
G01R31/31853	13	{Test of registers}	G01R31/3185	G01R31/3185		68
G01R31/318533	12	{using scanning techniques, e.g. LSSD, Boundary Scan, JTAG}	G01R31/3185	G01R31/3185		521
G01R31/318536	13	{Scan chain arrangements, e.g. connections, test bus, analog signals}	G01R31/3185	G01R31/3185		906
G01R31/318538	14	{Topological or mechanical aspects}	G01R31/3185	G01R31/3185		94
G01R31/318541	13	{Scan latches or cell details}	G01R31/3185	G01R31/3185		778
G01R31/318544	13	{Scanning methods, algorithms and patterns (G01R31/3183 takes precedence)}	G01R31/3185	G01R31/3185		506
G01R31/318547	14	{Data generators or compressors}	G01R31/3185	G01R31/3185		532
G01R31/31855	14	{Interconnection testing, e.g. crosstalk, shortcircuits}	G01R31/3185	G01R31/3185		158
G01R31/318552	13	{Clock circuits details}	G01R31/3185	G01R31/3185		577
G01R31/318555	13	{Control logic}	G01R31/3185	G01R31/3185		661
G01R31/318558	13	{Addressing or selecting of subparts of the device under test}	G01R31/3185	G01R31/3185		469
G01R31/318561	14	{Identification of the subpart}	G01R31/3185	G01R31/3185		56
G01R31/318563	14	{Multiple simultaneous testing of subparts}	G01R31/3185	G01R31/3185		207
G01R31/318566	13	{Comparators; Diagnosing the device under test}	G01R31/3185	G01R31/3185		281
G01R31/318569	13	{Error indication, logging circuits}	G01R31/3185	G01R31/3185		92
G01R31/318572	13	{Input/Output interfaces}	G01R31/3185	G01R31/3185		684
G01R31/318575	13	{Power distribution; Power saving}	G01R31/3185	G01R31/3185		228
G01R31/318577	13	{AC testing, e.g. current testing, burn-in}	G01R31/3185	G01R31/3185		105
G01R31/31858	14	{Delay testing}	G01R31/3185	G01R31/3185		208
G01R31/318583	13	{Design for test}	G01R31/3185	G01R31/3185		284
G01R31/318586	14	{with partial scan or non-scannable parts}	G01R31/3185	G01R31/3185		117
G01R31/318588	14	{Security aspects}	G01R31/3185	G01R31/3185		76
G01R31/318591	14	{Tools}	G01R31/3185	G01R31/3185		68
G01R31/318594	13	{Timing aspects (clock circuits G01R31/318552)}	G01R31/3185	G01R31/3185		398
G01R31/318597	13	{JTAG or boundary scan test of memory devices (other scan testing of memories G11C29/32)}	G01R31/3185	G01R31/3185		183
G01R31/3187	11	Built-in tests	G01R31/3187	G01R31/3187		682
G01R31/319	11	Tester hardware, i.e. output processing circuits	G01R31/319	G01R31/319		315
G01R31/31901	12	{Analysis of tester Performance; Tester characterization}	G01R31/319	G01R31/319		106
G01R31/31903	12	{tester configuration}	G01R31/319	G01R31/319		198
G01R31/31905	13	{Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture}	G01R31/319	G01R31/319		707
G01R31/31907	13	{Modular tester, e.g. controlling and coordinating instruments in a bus based architecture}	G01R31/319	G01R31/319		399
G01R31/31908	13	{Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns}	G01R31/319	G01R31/319		462
G01R31/3191	14	{Calibration}	G01R31/319	G01R31/319		442
G01R31/31912	13	{Tester/user interface}	G01R31/319	G01R31/319		284
G01R31/31914	13	{Portable Testers}	G01R31/319	G01R31/319		44
G01R31/31915	13	{In-circuit Testers}	G01R31/319	G01R31/319		121
G01R31/31917	12	{Stimuli generation or application of test patterns to the device under test [DUT]}	G01R31/319	G01R31/319		379
G01R31/31919	13	{Storing and outputting test patterns (G01R31/31924 takes precedence; arithmetic and random test patterns generator)}	G01R31/319	G01R31/319		363
G01R31/31921	14	{using compression techniques, e.g. patterns sequencer}	G01R31/319	G01R31/319		217
G01R31/31922	13	{Timing generation or clock distribution (G01R31/3191 takes precedence)}	G01R31/319	G01R31/319		626
G01R31/31924	13	{Voltage or current aspects, e.g. driver, receiver}	G01R31/319	G01R31/319		648
G01R31/31926	13	{Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing}	G01R31/319	G01R31/319		536
G01R31/31928	13	{Formatter (driver, receiver details G01R31/31924)}	G01R31/319	G01R31/319		163
G01R31/3193	12	with comparison between actual response and known fault free response {(receiver details G01R31/31924)}	G01R31/3193	G01R31/3193		337
G01R31/31932	13	{Comparators}	G01R31/3193	G01R31/3193		231
G01R31/31935	13	{Storing data, e.g. failure memory}	G01R31/3193	G01R31/3193		296
G01R31/31937	13	{Timing aspects, e.g. measuring propagation delay (G01R31/3191 and G01R31/31922 take precedence; marginal testing G06F11/24)}	G01R31/3193	G01R31/3193		539
G01R31/327	8	Testing of circuit interrupters, switches or circuit-breakers	G01R31/327	G01R31/327		5526
G01R31/3271	9	{of high voltage or medium voltage devices (G01R31/333 takes precedence)}	G01R31/327	G01R31/327		446
G01R31/3272	10	{Apparatus, systems or circuits therefor (G01R31/3275 takes precedence)}	G01R31/327	G01R31/327		1301
G01R31/3274	11	{Details related to measuring, e.g. sensing, displaying or computing; Measuring of variables related to the contact pieces, e.g. wear, position or resistance (measuring contact resistance G01R27/205)}	G01R31/327	G01R31/327		1081
G01R31/3275	10	{Fault detection or status indication}	G01R31/327	G01R31/327		1936
G01R31/3277	9	{of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches}	G01R31/327	G01R31/327		1837
G01R31/3278	10	{of relays, solenoids or reed switches (measuring contact resistance G01R27/205; high voltage magnetic switches G01R31/3271, G01R31/333; testing electric windings G01R31/72; monitoring of fail safe circuits H01H47/002)}	G01R31/327	G01R31/327		2021
G01R31/333	9	Testing of the switching capacity of high-voltage circuit-breakers {; Testing of breaking capacity or related variables, e.g. post arc current or transient recovery voltage}	G01R31/333	G01R31/333		114
G01R31/3333	10	{Apparatus, systems or circuits therefor}	G01R31/333	G01R31/333		255
G01R31/3336	11	{Synthetic testing, i.e. with separate current and voltage generators simulating distance fault conditions}	G01R31/333	G01R31/333		346
G01R31/34	8	Testing dynamo-electric machines	G01R31/34	G01R31/34		5691
G01R31/343	9	{in operation}	G01R31/34	G01R31/34		7095
G01R31/346	9	{Testing of armature or field windings}	G01R31/34	G01R31/34		1686
G01R31/36	8	Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]<br><br><u>NOTE</u><br><br>This group covers arrangements for measuring, testing or indicating electrical conditions or variables of accumulators or electric batteries. Arrangements for monitoring, measuring, testing or indicating condition structurally associated with the battery are covered by H01M, e.g. by group H01M10/48	G01R31/36	G01R31/36		4706
G01R31/364	9	Battery terminal connectors with integrated measuring arrangements	G01R31/364	G01R31/364		1137
G01R31/3644	9	{Constructional arrangements}	G01R31/36	G01R31/364		1230
G01R31/3646	10	{for indicating electrical conditions or variables, e.g. visual or audible indicators}	G01R31/36	G01R31/364		1804
G01R31/3647	10	{for determining the ability of a battery to perform a critical function, e.g. cranking}	G01R31/36	G01R31/364		606
G01R31/3648	10	{comprising digital calculation means, e.g. for performing an algorithm}	G01R31/36	G01R31/364		4648
G01R31/367	9	Software therefor, e.g. for battery testing using modelling or look-up tables	G01R31/367	G01R31/367		15586
G01R31/371	9	with remote indication, e.g. on external chargers	G01R31/371	G01R31/371		1845
G01R31/374	9	with means for correcting the measurement for temperature or ageing	G01R31/374	G01R31/374		2368
G01R31/378	9	specially adapted for the type of battery or accumulator	G01R31/378	G01R31/378		4514
G01R31/379	10	for lead-acid batteries	G01R31/379	G01R31/379		662
G01R31/38	10	{Primary cells, i.e. not rechargeable}	G01R31/378	G01R31/38		44
G01R31/382	9	Arrangements for monitoring battery or accumulator variables, e.g. SoC	G01R31/382	G01R31/382		9336
G01R31/3828	10	using current integration	G01R31/3828	G01R31/3828		956
G01R31/3832	11	without measurement of battery voltage	G01R31/3832	G01R31/3832		244
G01R31/3833	12	{using analog integrators, e.g. coulomb-meters}	G01R31/3832	G01R31/3833		78
G01R31/3835	10	involving only voltage measurements	G01R31/3835	G01R31/3835		4458
G01R31/3842	10	combining voltage and current measurements	G01R31/3842	G01R31/3842		5181
G01R31/385	9	Arrangements for measuring battery or accumulator variables (for monitoring G01R31/382)	G01R31/385	G01R31/385		8842
G01R31/386	10	{using test-loads}	G01R31/385	G01R31/386		682
G01R31/3865	10	{related to manufacture, e.g. testing after manufacture}	G01R31/385	G01R31/3865		1215
G01R31/387	10	Determining ampere-hour charge capacity or SoC	G01R31/387	G01R31/387		3373
G01R31/388	11	involving voltage measurements	G01R31/388	G01R31/388		3132
G01R31/389	9	Measuring internal impedance, internal conductance or related variables	G01R31/389	G01R31/389		7631
G01R31/392	9	Determining battery ageing or deterioration, e.g. state of health	G01R31/392	G01R31/392		13996
G01R31/396	9	Acquisition or processing of data for testing or for monitoring individual cells or groups of cells within a battery	G01R31/396	G01R31/396		10730
G01R31/40	8	Testing power supplies (testing photovoltaic devices H02S50/10)	G01R31/40	G01R31/40		6333
G01R31/42	9	AC power supplies	G01R31/42	G01R31/42		1830
G01R31/44	8	Testing lamps	G01R31/44	G01R31/44		2083
G01R31/50	8	Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections (testing of sparking plugs H01T13/58)	G01R31/50	G01R31/50		5937
G01R31/52	9	Testing for short-circuits, leakage current or ground faults	G01R31/52	G01R31/52		15144
G01R31/54	9	Testing for continuity	G01R31/54	G01R31/54		5094
G01R31/55	9	Testing for incorrect line connections	G01R31/55	G01R31/55		519
G01R31/56	9	Testing of electric apparatus (testing of transformers G01R31/62; testing of connections G01R31/66)	G01R31/56	G01R31/56		1442
G01R31/58	9	Testing of lines, cables or conductors (testing of electric windings G01R31/72)	G01R31/58	G01R31/58		5806
G01R31/59	10	while the cable continuously passes the testing apparatus, e.g. during manufacture	G01R31/59	G01R31/59		532
G01R31/60	10	Identification of wires in a multicore cable	G01R31/60	G01R31/60		588
G01R31/62	9	Testing of transformers	G01R31/62	G01R31/62		3033
G01R31/64	9	Testing of capacitors	G01R31/64	G01R31/64		975
G01R31/66	9	Testing of connections, e.g. of plugs or non-disconnectable joints (testing for incorrect line connections G01R31/55)	G01R31/66	G01R31/66		1939
G01R31/67	10	Testing the correctness of wire connections in electric apparatus or circuits	G01R31/67	G01R31/67		1266
G01R31/68	10	Testing of releasable connections, e.g. of terminals mounted on a printed circuit board	G01R31/68	G01R31/68		752
G01R31/69	11	of terminals at the end of a cable or a wire harness; of plugs; of sockets, e.g. wall sockets or power sockets in appliances	G01R31/69	G01R31/69		1444
G01R31/70	10	Testing of connections between components and printed circuit boards (G01R31/68 takes precedence)	G01R31/70	G01R31/70		298
G01R31/71	11	Testing of solder joints	G01R31/71	G01R31/71		224
G01R31/72	9	Testing of electric windings (testing of transformers G01R31/62)	G01R31/72	G01R31/72		1819
G01R31/74	9	Testing of fuses	G01R31/74	G01R31/74		494
G01R33/00	7	Arrangements or instruments for measuring magnetic variables	G01R33/00	G01R33/00		543
G01R33/0005	8	{Geometrical arrangement of magnetic sensor elements; Apparatus combining different magnetic sensor types (G01R33/0206 takes precedence)}	G01R33/00	G01R33/00		797
G01R33/0011	8	{comprising means, e.g. flux concentrators, flux guides, for guiding or concentrating the magnetic flux, e.g. to the magnetic sensor}	G01R33/00	G01R33/00		689
G01R33/0017	8	{Means for compensating offset magnetic fields or the magnetic flux to be measured; Means for generating calibration magnetic fields}	G01R33/00	G01R33/00		731
G01R33/0023	8	{Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration (G01R33/0017 takes precedence)}	G01R33/00	G01R33/00		876
G01R33/0029	9	{Treating the measured signals, e.g. removing offset or noise}	G01R33/00	G01R33/00		865
G01R33/0035	9	{Calibration of single magnetic sensors, e.g. integrated calibration}	G01R33/00	G01R33/00		593
G01R33/0041	9	{using feed-back or modulation techniques}	G01R33/00	G01R33/00		342
G01R33/0047	8	{Housings or packaging of magnetic sensors (packaging of semiconductor devices H10W99/00); Holders}	G01R33/00	G01R33/00		528
G01R33/0052	8	{Manufacturing aspects; Manufacturing of single devices, i.e. of semiconductor magnetic sensor chips (devices based on galvano-magnetic effect or the like H10N50/85)}	G01R33/00	G01R33/00		961
G01R33/0058	8	{using bistable elements, e.g. Reed switches}	G01R33/00	G01R33/00		35
G01R33/0064	8	{comprising means for performing simulations, e.g. of the magnetic variable to be measured}	G01R33/00	G01R33/00		96
G01R33/007	8	{Environmental aspects, e.g. temperature variations, radiation, stray fields (G01R33/025 takes precedence)}	G01R33/00	G01R33/00		229
G01R33/0076	9	{Protection, e.g. with housings against stray fields}	G01R33/00	G01R33/00		270
G01R33/0082	9	{Compensation, e.g. compensating for temperature changes}	G01R33/00	G01R33/00		359
G01R33/0088	8	{use of bistable or switching devices, e.g. Reed-switches}	G01R33/00	G01R33/00		73
G01R33/0094	8	{Sensor arrays}	G01R33/00	G01R33/00		752
G01R33/02	8	Measuring direction or magnitude of magnetic fields or magnetic flux (G01R33/20 takes precedence)<br><br><u>NOTE</u><br><br> Groups G01R33/022, G01R33/10 take precedence over groups G01R33/025&#160;-&#160;G01R33/09. 	G01R33/02	G01R33/02		3618
G01R33/0206	9	{Three-component magnetometers}	G01R33/02	G01R33/02		1048
G01R33/0213	9	{using deviation of charged particles by the magnetic field}	G01R33/02	G01R33/02		108
G01R33/022	9	Measuring gradient	G01R33/022	G01R33/022		648
G01R33/025	9	Compensating stray fields {(G01R33/0017 takes precedence)}	G01R33/025	G01R33/025		421
G01R33/028	9	Electrodynamic magnetometers	G01R33/028	G01R33/028		468
G01R33/0283	10	{in which a current or voltage is generated due to relative movement of conductor and magnetic field}	G01R33/028	G01R33/028		238
G01R33/0286	10	{comprising microelectromechanical systems [MEMS] (MEMS devices in general B81B)}	G01R33/028	G01R33/028		207
G01R33/032	9	using magneto-optic devices, e.g. Faraday {or Cotton-Mouton effect}	G01R33/032	G01R33/032		1586
G01R33/0322	10	{using the Faraday or Voigt effect}	G01R33/032	G01R33/032		384
G01R33/0325	10	{using the Kerr effect}	G01R33/032	G01R33/032		101
G01R33/0327	10	{with application of magnetostriction}	G01R33/032	G01R33/032		194
G01R33/035	9	using superconductive devices	G01R33/035	G01R33/035		249
G01R33/0352	10	{Superconductive magneto-resistances}	G01R33/035	G01R33/035		24
G01R33/0354	10	{SQUIDS}	G01R33/035	G01R33/035		440
G01R33/0356	11	{with flux feedback}	G01R33/035	G01R33/035		135
G01R33/0358	11	{coupling the flux to the SQUID (gradiometer coils G01R33/022; coils with superconductive winding H01F6/06)}	G01R33/035	G01R33/035		239
G01R33/038	9	using permanent magnets, e.g. balances, torsion devices	G01R33/038	G01R33/038		440
G01R33/0385	10	{in relation with magnetic force measurements (magnetic force microscopes G01Q60/50)}	G01R33/038	G01R33/038		173
G01R33/04	9	using the flux-gate principle	G01R33/04	G01R33/04		924
G01R33/045	10	{in single-, or multi-aperture elements}	G01R33/04	G01R33/04		127
G01R33/05	10	in thin-film element	G01R33/05	G01R33/05		184
G01R33/06	9	using galvano-magnetic devices	G01R33/06	G01R33/06		740
G01R33/063	10	{Magneto-impedance sensors; Nanocristallin sensors}	G01R33/06	G01R33/06		264
G01R33/066	10	{field-effect magnetic sensors, e.g. magnetic transistor}	G01R33/06	G01R33/06		61
G01R33/07	10	Hall effect devices	G01R33/07	G01R33/07		2533
G01R33/072	11	{Constructional adaptation of the sensor to specific applications}	G01R33/07	G01R33/07		1172
G01R33/075	12	{Hall devices configured for spinning current measurements}	G01R33/07	G01R33/07		248
G01R33/077	11	{Vertical Hall-effect devices}	G01R33/07	G01R33/07		271
G01R33/09	10	Magnetoresistive devices	G01R33/09	G01R33/09		2034
G01R33/091	11	{Constructional adaptation of the sensor to specific applications}	G01R33/09	G01R33/09		861
G01R33/093	11	{using multilayer structures, e.g. giant magnetoresistance sensors (thin magnetic films H01F10/00)}	G01R33/09	G01R33/09		3027
G01R33/095	11	{extraordinary magnetoresistance sensors}	G01R33/09	G01R33/09		113
G01R33/096	11	{anisotropic magnetoresistance sensors}	G01R33/09	G01R33/09		568
G01R33/098	11	{comprising tunnel junctions, e.g. tunnel magnetoresistance sensors}	G01R33/09	G01R33/09		1554
G01R33/10	9	Plotting field distribution {; Measuring field distribution}	G01R33/10	G01R33/10		778
G01R33/12	8	Measuring magnetic properties of articles or specimens of solids or fluids (involving magnetic resonance G01R33/20)	G01R33/12	G01R33/12		1842
G01R33/1207	9	{Testing individual magnetic storage devices, e.g. records carriers or digital storage elements (functional testing G06F11/00, G06F11/28)}	G01R33/12	G01R33/12		365
G01R33/1215	9	{Measuring magnetisation; Particular magnetometers therefor (G01R33/14 takes precedence; electrodynamic magnetometers G01R33/028)}	G01R33/12	G01R33/12		388
G01R33/1223	9	{Measuring permeability, i.e. permeameters (G01R33/14 takes precedence)}	G01R33/12	G01R33/12		410
G01R33/123	9	{Measuring loss due to hysteresis (G01R33/14 takes precedence)}	G01R33/12	G01R33/12		193
G01R33/1238	9	{Measuring superconductive properties}	G01R33/12	G01R33/12		247
G01R33/1246	10	{Measuring critical current}	G01R33/12	G01R33/12		121
G01R33/1253	9	{Measuring galvano-magnetic properties}	G01R33/12	G01R33/12		338
G01R33/1261	9	{using levitation techniques}	G01R33/12	G01R33/12		46
G01R33/1269	9	{of molecules labeled with magnetic beads (magnetic particles for bio assay G01N33/54326)}	G01R33/12	G01R33/12		281
G01R33/1276	9	{of magnetic particles, e.g. imaging of magnetic nanoparticles (G01R33/1269 takes precedence)}	G01R33/12	G01R33/12		291
G01R33/1284	9	{Spin resolved measurements; Influencing spins during measurements, e.g. in spintronics devices}	G01R33/12	G01R33/12		289
G01R33/1292	9	{Measuring domain wall position or domain wall motion}	G01R33/12	G01R33/12		77
G01R33/14	9	Measuring or plotting hysteresis curves {(G01R33/1207 takes precedence)}	G01R33/14	G01R33/14		398
G01R33/16	9	Measuring susceptibility {(G01R33/1238 takes precedence)}	G01R33/16	G01R33/16		215
G01R33/18	9	Measuring magnetostrictive properties	G01R33/18	G01R33/18		230
G01R33/20	8	involving magnetic resonance (medical aspects A61B5/055; magnetic resonance gyrometers G01C19/60)	G01R33/20	G01R33/20		331
G01R33/24	9	for measuring direction or magnitude of magnetic fields or magnetic flux	G01R33/24	G01R33/24		572
G01R33/243	10	{Spatial mapping of the polarizing magnetic field}	G01R33/24	G01R33/24		286
G01R33/246	10	{Spatial mapping of the RF magnetic field B1}	G01R33/24	G01R33/24		277
G01R33/26	10	using optical pumping	G01R33/26	G01R33/26		931
G01R33/28	9	Details of apparatus provided for in groups G01R33/44&#160;-&#160;G01R33/64	G01R33/28	G01R33/28		1078
G01R33/281	10	{Means for the use of in vitro contrast agents (G01R33/282 takes precedence; involving use of a contrast agent in MR imaging G01R33/5601; in vivo contrast agents A61K49/0002)}	G01R33/28	G01R33/28		290
G01R33/282	10	{Means specially adapted for hyperpolarisation or for hyperpolarised contrast agents, e.g. for the generation of hyperpolarised gases using optical pumping cells, for storing hyperpolarised contrast agents or for the determination of the polarisation of a hyperpolarised contrast agent}	G01R33/28	G01R33/28		354
G01R33/283	10	{Intercom or optical viewing arrangements, structurally associated with NMR apparatus}	G01R33/28	G01R33/28		474
G01R33/285	10	{Invasive instruments, e.g. catheters or biopsy needles, specially adapted for tracking, guiding or visualization by NMR}	G01R33/28	G01R33/28		471
G01R33/286	11	{involving passive visualization of interventional instruments, i.e. making the instrument visible as part of the normal MR process}	G01R33/28	G01R33/28		164
G01R33/287	11	{involving active visualization of interventional instruments, e.g. using active tracking RF coils or coils for intentionally creating magnetic field inhomogeneities}	G01R33/28	G01R33/28		244
G01R33/288	10	{Provisions within MR facilities for enhancing safety during MR, e.g. reduction of the specific absorption rate [SAR], detection of ferromagnetic objects in the scanner room}	G01R33/28	G01R33/28		882
G01R33/30	10	Sample handling arrangements, e.g. sample cells, spinning mechanisms	G01R33/30	G01R33/30		491
G01R33/302	11	{Miniaturized sample handling arrangements for sampling small quantities, e.g. flow-through microfluidic NMR chips}	G01R33/30	G01R33/30		162
G01R33/305	11	{specially adapted for high-pressure applications}	G01R33/30	G01R33/30		66
G01R33/307	11	{specially adapted for moving the sample relative to the MR system, e.g. spinning mechanisms, flow cells or means for positioning the sample inside a spectrometer}	G01R33/30	G01R33/30		754
G01R33/31	11	Temperature control thereof	G01R33/31	G01R33/31		262
G01R33/32	10	Excitation or detection systems, e.g. using radio frequency signals	G01R33/32	G01R33/32		197
G01R33/323	11	{Detection of MR without the use of RF or microwaves, e.g. force-detected MR, thermally detected MR, MR detection via electrical conductivity, optically detected MR}	G01R33/32	G01R33/32		279
G01R33/326	12	{involving a SQUID}	G01R33/32	G01R33/32		63
G01R33/34	11	Constructional details, e.g. resonators {, specially adapted to MR}	G01R33/34	G01R33/34		746
G01R33/34007	12	{Manufacture of RF coils, e.g. using printed circuit board technology; additional hardware for providing mechanical support to the RF coil assembly or to part thereof, e.g. a support for moving the coil assembly relative to the remainder of the MR system}	G01R33/34	G01R33/34		1020
G01R33/34015	12	{Temperature-controlled RF coils}	G01R33/34	G01R33/34		61
G01R33/34023	13	{Superconducting RF coils}	G01R33/34	G01R33/34		210
G01R33/3403	13	{Means for cooling of the RF coils, e.g. a refrigerator or a cooling vessel specially adapted for housing an RF coil}	G01R33/34	G01R33/34		186
G01R33/34038	12	{Loopless coils, i.e. linear wire antennas}	G01R33/34	G01R33/34		50
G01R33/34046	12	{Volume type coils, e.g. bird-cage coils; Quadrature bird-cage coils; Circularly polarised coils}	G01R33/34	G01R33/34		875
G01R33/34053	13	{Solenoid coils; Toroidal coils}	G01R33/34	G01R33/34		340
G01R33/34061	13	{Helmholtz coils}	G01R33/34	G01R33/34		166
G01R33/34069	13	{Saddle coils}	G01R33/34	G01R33/34		190
G01R33/34076	13	{Birdcage coils}	G01R33/34	G01R33/34		397
G01R33/34084	12	{implantable coils or coils being geometrically adaptable to the sample, e.g. flexible coils or coils comprising mutually movable parts}	G01R33/34	G01R33/34		772
G01R33/34092	12	{RF coils specially adapted for NMR spectrometers}	G01R33/34	G01R33/34		379
G01R33/341	12	comprising surface coils	G01R33/341	G01R33/341		918
G01R33/3415	13	comprising arrays of sub-coils {, i.e. phased-array coils with flexible receiver channels}	G01R33/3415	G01R33/3415		1547
G01R33/343	12	of slotted-tube or loop-gap type	G01R33/343	G01R33/343		117
G01R33/345	12	of waveguide type (G01R33/343 takes precedence)	G01R33/345	G01R33/345		187
G01R33/3453	13	{Transverse electromagnetic [TEM] coils}	G01R33/345	G01R33/345		92
G01R33/3456	14	{Stripline resonators}	G01R33/345	G01R33/345		55
G01R33/36	11	Electrical details, e.g. matching or coupling of the coil to the receiver	G01R33/36	G01R33/36		898
G01R33/3607	12	{RF waveform generators, e.g. frequency generators, amplitude-, frequency- or phase modulators or shifters, pulse programmers, digital to analog converters for the RF signal, means for filtering or attenuating of the RF signal}	G01R33/36	G01R33/36		489
G01R33/3614	12	{RF power amplifiers}	G01R33/36	G01R33/36		321
G01R33/3621	12	{NMR receivers or demodulators, e.g. preamplifiers, means for frequency modulation of the MR signal using a digital down converter, means for analog to digital conversion [ADC] or for filtering or processing of the MR signal such as bandpass filtering, resampling, decimation or interpolation}	G01R33/36	G01R33/36		720
G01R33/3628	12	{Tuning/matching of the transmit/receive coil}	G01R33/36	G01R33/36		734
G01R33/3635	13	{Multi-frequency operation}	G01R33/36	G01R33/36		352
G01R33/3642	12	{Mutual coupling or decoupling of multiple coils, e.g. decoupling of a receive coil from a transmission coil, or intentional coupling of RF coils, e.g. for RF magnetic field amplification}	G01R33/36	G01R33/36		310
G01R33/365	13	{Decoupling of multiple RF coils wherein the multiple RF coils have the same function in MR, e.g. decoupling of a receive coil from another receive coil in a receive coil array, decoupling of a transmission coil from another transmission coil in a transmission coil array}	G01R33/36	G01R33/36		326
G01R33/3657	13	{Decoupling of multiple RF coils wherein the multiple RF coils do not have the same function in MR, e.g. decoupling of a transmission coil from a receive coil}	G01R33/36	G01R33/36		383
G01R33/3664	12	{Switching for purposes other than coil coupling or decoupling, e.g. switching between a phased array mode and a quadrature mode, switching between surface coil modes of different geometrical shapes, switching from a whole body reception coil to a local reception coil or switching for automatic coil selection in moving table MR or for changing the field-of-view (G01R33/3671 takes precedence)}	G01R33/36	G01R33/36		309
G01R33/3671	12	{involving modulation of the quality factor of the RF coil (G01R33/3642 takes precedence)}	G01R33/36	G01R33/36		50
G01R33/3678	12	{involving quadrature drive or detection, e.g. a circularly polarized RF magnetic field}	G01R33/36	G01R33/36		277
G01R33/3685	12	{Means for reducing sheath currents, e.g. RF traps, baluns}	G01R33/36	G01R33/36		201
G01R33/3692	12	{involving signal transmission without using electrically conductive connections, e.g. wireless communication or optical communication of the MR signal or an auxiliary signal other than the MR signal}	G01R33/36	G01R33/36		459
G01R33/38	10	Systems for generation, homogenisation or stabilisation of the main or gradient magnetic field	G01R33/38	G01R33/38		249
G01R33/3802	11	{Manufacture or installation of magnet assemblies; Additional hardware for transportation or installation of the magnet assembly or for providing mechanical support to components of the magnet assembly}	G01R33/38	G01R33/38		431
G01R33/3804	11	{Additional hardware for cooling or heating of the magnet assembly, for housing a cooled or heated part of the magnet assembly or for temperature control of the magnet assembly}	G01R33/38	G01R33/38		649
G01R33/3806	11	{Open magnet assemblies for improved access to the sample, e.g. C-type or U-type magnets}	G01R33/38	G01R33/38		674
G01R33/3808	11	{Magnet assemblies for single-sided MR wherein the magnet assembly is located on one side of a subject only; Magnet assemblies for inside-out MR, e.g. for MR in a borehole or in a blood vessel, or magnet assemblies for fringe-field MR}	G01R33/38	G01R33/38		346
G01R33/381	11	using electromagnets	G01R33/381	G01R33/381		360
G01R33/3815	12	with superconducting coils, e.g. power supply therefor	G01R33/3815	G01R33/3815		1478
G01R33/383	11	using permanent magnets	G01R33/383	G01R33/383		832
G01R33/385	11	using gradient magnetic field coils	G01R33/385	G01R33/385		1321
G01R33/3852	12	{Gradient amplifiers; means for controlling the application of a gradient magnetic field to the sample, e.g. a gradient signal synthesizer}	G01R33/385	G01R33/385		390
G01R33/3854	12	{means for active and/or passive vibration damping or acoustical noise suppression in gradient magnet coil systems}	G01R33/385	G01R33/385		400
G01R33/3856	12	{Means for cooling the gradient coils or thermal shielding of the gradient coils}	G01R33/385	G01R33/385		321
G01R33/3858	12	{Manufacture and installation of gradient coils, means for providing mechanical support to parts of the gradient-coil assembly (manufacture of inductances or coils in general H01F41/00)}	G01R33/385	G01R33/385		220
G01R33/387	11	Compensation of inhomogeneities	G01R33/387	G01R33/387		142
G01R33/3873	12	using ferromagnetic bodies {; Passive shimming}	G01R33/3873	G01R33/3873		468
G01R33/3875	12	using correction coil assemblies, e.g. active shimming	G01R33/3875	G01R33/3875		714
G01R33/389	11	Field stabilisation {, e.g. by field measurements and control means or indirectly by current stabilisation}	G01R33/389	G01R33/389		315
G01R33/42	10	Screening	G01R33/42	G01R33/42		118
G01R33/421	11	of main or gradient magnetic field	G01R33/421	G01R33/421		391
G01R33/4215	12	{of the gradient magnetic field, e.g. using passive or active shielding of the gradient magnetic field}	G01R33/421	G01R33/421		266
G01R33/422	11	of the radio frequency field	G01R33/422	G01R33/422		557
G01R33/44	9	using nuclear magnetic resonance [NMR] (G01R33/24, G01R33/62 take precedence)	G01R33/44	G01R33/44		524
G01R33/441	10	{Nuclear Quadrupole Resonance [NQR] Spectroscopy and Imaging}	G01R33/44	G01R33/44		220
G01R33/443	10	{Assessment of an electric or a magnetic field, e.g. spatial mapping, determination of a B0 drift or dosimetry}	G01R33/44	G01R33/44		189
G01R33/445	10	{MR involving a non-standard magnetic field B0, e.g. of low magnitude as in the earth&apos;s magnetic field or in nanoTesla spectroscopy, comprising a polarizing magnetic field for pre-polarisation, B0 with a temporal variation of its magnitude or direction such as field cycling of B0 or rotation of the direction of B0, or spatially inhomogeneous B0 like in fringe-field MR or in stray-field imaging}	G01R33/44	G01R33/44		476
G01R33/446	10	{Multifrequency selective RF pulses, e.g. multinuclear acquisition mode (spatially selective RF pulses G01R33/4833)}	G01R33/44	G01R33/44		206
G01R33/448	10	{Relaxometry, i.e. quantification of relaxation times or spin density (G01R33/50 takes precedence)}	G01R33/44	G01R33/44		478
G01R33/46	10	NMR spectroscopy	G01R33/46	G01R33/46		670
G01R33/4608	11	{RF excitation sequences for enhanced detection, e.g. NOE, polarisation transfer, selection of a coherence transfer pathway}	G01R33/46	G01R33/46		163
G01R33/4616	11	{using specific RF pulses or specific modulation schemes, e.g. stochastic excitation, adiabatic RF pulses, composite pulses, binomial pulses, Shinnar-le-Roux pulses, spectrally selective pulses not being used for spatial selection}	G01R33/46	G01R33/46		179
G01R33/4625	11	{Processing of acquired signals, e.g. elimination of phase errors, baseline fitting, chemometric analysis}	G01R33/46	G01R33/46		461
G01R33/4633	11	{Sequences for multi-dimensional NMR}	G01R33/46	G01R33/46		160
G01R33/4641	11	{Sequences for NMR spectroscopy of samples with ultrashort relaxation times such as solid samples}	G01R33/46	G01R33/46		57
G01R33/465	11	applied to biological material, e.g. in vitro testing	G01R33/465	G01R33/465		534
G01R33/48	10	NMR imaging systems	G01R33/48	G01R33/48		760
G01R33/4802	11	{Travelling-wave MR}	G01R33/48	G01R33/48		25
G01R33/4804	11	{Spatially selective measurement of temperature or pH}	G01R33/48	G01R33/48		308
G01R33/4806	11	{Functional imaging of brain activation}	G01R33/48	G01R33/48		581
G01R33/4808	11	{Multimodal MR, e.g. MR combined with positron emission tomography [PET], MR combined with ultrasound or MR combined with computed tomography [CT]}	G01R33/48	G01R33/48		464
G01R33/481	12	{MR combined with positron emission tomography [PET] or single photon emission computed tomography [SPECT]}	G01R33/48	G01R33/48		474
G01R33/4812	12	{MR combined with X-ray or computed tomography [CT]}	G01R33/48	G01R33/48		210
G01R33/4814	12	{MR combined with ultrasound}	G01R33/48	G01R33/48		221
G01R33/4816	11	{NMR imaging of samples with ultrashort relaxation times such as solid samples, e.g. MRI using ultrashort TE [UTE], single point imaging, constant time imaging}	G01R33/48	G01R33/48		258
G01R33/4818	11	{MR characterised by data acquisition along a specific k-space trajectory or by the temporal order of k-space coverage, e.g. centric or segmented coverage of k-space}	G01R33/48	G01R33/48		671
G01R33/482	12	{using a Cartesian trajectory}	G01R33/48	G01R33/48		362
G01R33/4822	13	{in three dimensions}	G01R33/48	G01R33/48		310
G01R33/4824	12	{using a non-Cartesian trajectory}	G01R33/48	G01R33/48		708
G01R33/4826	13	{in three dimensions}	G01R33/48	G01R33/48		247
G01R33/4828	11	{Resolving the MR signals of different chemical species, e.g. water-fat imaging}	G01R33/48	G01R33/48		871
G01R33/483	11	with selection of signals or spectra from particular regions of the volume, e.g. in vivo spectroscopy	G01R33/483	G01R33/483		252
G01R33/4831	12	{using B1 gradients, e.g. rotating frame techniques, use of surface coils}	G01R33/483	G01R33/483		72
G01R33/4833	12	{using spatially selective excitation of the volume of interest, e.g. selecting non-orthogonal or inclined slices}	G01R33/483	G01R33/483		534
G01R33/4835	13	{of multiple slices}	G01R33/483	G01R33/483		779
G01R33/4836	13	{using an RF pulse being spatially selective in more than one spatial dimension, e.g. a 2D pencil-beam excitation pulse}	G01R33/483	G01R33/483		80
G01R33/4838	12	{using spatially selective suppression or saturation of MR signals}	G01R33/483	G01R33/483		242
G01R33/485	12	based on chemical shift information {[CSI] or spectroscopic imaging, e.g. to acquire the spatial distributions of metabolites}	G01R33/485	G01R33/485		439
G01R33/50	11	based on the determination of relaxation times {, e.g. T1 measurement by IR sequences; T2 measurement by multiple-echo sequences}	G01R33/50	G01R33/50		1088
G01R33/54	11	Signal processing systems, e.g. using pulse sequences {; Generation or control of pulse sequences; Operator console}	G01R33/54	G01R33/54		949
G01R33/543	12	{Control of the operation of the MR system, e.g. setting of acquisition parameters prior to or during MR data acquisition, dynamic shimming, use of one or more scout images for scan plane prescription (G01R33/546 takes precedence)}	G01R33/54	G01R33/54		1704
G01R33/546	12	{Interface between the MR system and the user, e.g. for controlling the operation of the MR system or for the design of pulse sequences}	G01R33/54	G01R33/54		538
G01R33/56	12	Image enhancement or correction, e.g. subtraction or averaging techniques {, e.g. improvement of signal-to-noise ratio and resolution}	G01R33/56	G01R33/56		933
G01R33/5601	13	{involving use of a contrast agent for contrast manipulation, e.g. a paramagnetic, super-paramagnetic, ferromagnetic or hyperpolarised contrast agent}	G01R33/56	G01R33/56		1172
G01R33/5602	13	{by filtering or weighting based on different relaxation times within the sample, e.g. T1 weighting using an inversion pulse}	G01R33/56	G01R33/56		766
G01R33/5604	13	{Microscopy; Zooming}	G01R33/56	G01R33/56		55
G01R33/5605	13	{by transferring coherence or polarization from a spin species to another, e.g. creating magnetization transfer contrast [MTC], polarization transfer using nuclear Overhauser enhancement [NOE]}	G01R33/56	G01R33/56		258
G01R33/5607	13	{by reducing the NMR signal of a particular spin species, e.g. of a chemical species for fat suppression, or of a moving spin species for black-blood imaging}	G01R33/56	G01R33/56		479
G01R33/5608	13	{Data processing and visualization specially adapted for MR, e.g. for feature analysis and pattern recognition on the basis of measured MR data, segmentation of measured MR data, edge contour detection on the basis of measured MR data, for enhancing measured MR data in terms of signal-to-noise ratio by means of noise filtering or apodization, for enhancing measured MR data in terms of resolution by means for deblurring, windowing, zero filling, or generation of gray-scaled images, colour-coded images or images displaying vectors instead of pixels (image data processing or generation, in general G06T)}	G01R33/56	G01R33/56		2905
G01R33/561	13	by reduction of the scanning time, i.e. fast acquiring systems, e.g. using echo-planar pulse sequences	G01R33/561	G01R33/561		893
G01R33/5611	14	{Parallel magnetic resonance imaging, e.g. sensitivity encoding [SENSE], simultaneous acquisition of spatial harmonics [SMASH], unaliasing by Fourier encoding of the overlaps using the temporal dimension [UNFOLD], k-t-broad-use linear acquisition speed-up technique [k-t-BLAST], k-t-SENSE (structural details of arrays of sub-coils G01R33/3415)}	G01R33/561	G01R33/561		1263
G01R33/5612	15	{Parallel RF transmission, i.e. RF pulse transmission using a plurality of independent transmission channels}	G01R33/561	G01R33/561		255
G01R33/5613	14	{Generating steady state signals, e.g. low flip angle sequences [FLASH]}	G01R33/561	G01R33/561		295
G01R33/5614	15	{using a fully balanced steady-state free precession [bSSFP] pulse sequence, e.g. trueFISP}	G01R33/561	G01R33/561		220
G01R33/5615	14	{Echo train techniques involving acquiring plural, differently encoded, echo signals after one RF excitation, e.g. using gradient refocusing in echo planar imaging [EPI], RF refocusing in rapid acquisition with relaxation enhancement [RARE] or using both RF and gradient refocusing in gradient and spin echo imaging [GRASE]}	G01R33/561	G01R33/561		456
G01R33/5616	15	{using gradient refocusing, e.g. EPI}	G01R33/561	G01R33/561		648
G01R33/5617	15	{using RF refocusing, e.g. RARE}	G01R33/561	G01R33/561		562
G01R33/5618	15	{using both RF and gradient refocusing, e.g. GRASE}	G01R33/561	G01R33/561		116
G01R33/5619	14	{by temporal sharing of data, e.g. keyhole, block regional interpolation scheme for k-Space [BRISK]}	G01R33/561	G01R33/561		175
G01R33/563	13	of moving material, e.g. flow contrast angiography	G01R33/563	G01R33/563		460
G01R33/56308	14	{Characterization of motion or flow; Dynamic imaging}	G01R33/563	G01R33/563		532
G01R33/56316	15	{involving phase contrast techniques}	G01R33/563	G01R33/563		270
G01R33/56325	15	{Cine imaging}	G01R33/563	G01R33/563		176
G01R33/56333	15	{Involving spatial modulation of the magnetization within an imaged region, e.g. spatial modulation of magnetization [SPAMM] tagging (perfusion imaging based on arterial spin tagging G01R33/56366)}	G01R33/563	G01R33/563		90
G01R33/56341	14	{Diffusion imaging}	G01R33/563	G01R33/563		958
G01R33/5635	14	{Angiography, e.g. contrast-enhanced angiography [CE-MRA] or time-of-flight angiography [TOF-MRA]}	G01R33/563	G01R33/563		524
G01R33/56358	14	{Elastography}	G01R33/563	G01R33/563		164
G01R33/56366	14	{Perfusion imaging}	G01R33/563	G01R33/563		420
G01R33/56375	14	{Intentional motion of the sample during MR, e.g. moving table imaging}	G01R33/563	G01R33/563		125
G01R33/56383	15	{involving motion of the sample as a whole, e.g. multistation MR or MR with continuous table motion}	G01R33/563	G01R33/563		148
G01R33/56391	15	{involving motion of a part of the sample with respect to another part of the sample, e.g. MRI of active joint motion}	G01R33/563	G01R33/563		22
G01R33/565	13	Correction of image distortions, e.g. due to magnetic field inhomogeneities	G01R33/565	G01R33/565		565
G01R33/56509	14	{due to motion, displacement or flow, e.g. gradient moment nulling (G01R33/567 takes precedence)}	G01R33/565	G01R33/565		1159
G01R33/56518	14	{due to eddy currents, e.g. caused by switching of the gradient magnetic field}<br><br><u>NOTE</u><br><br>This group only covers correction of artifacts caused by gradient-non-linearity.	G01R33/565	G01R33/565		447
G01R33/56527	14	{due to chemical shift effects}	G01R33/565	G01R33/565		133
G01R33/56536	14	{due to magnetic susceptibility variations}	G01R33/565	G01R33/565		272
G01R33/56545	14	{caused by finite or discrete sampling, e.g. Gibbs ringing, truncation artefacts, phase aliasing artefacts}	G01R33/565	G01R33/565		265
G01R33/56554	14	{caused by acquiring plural, differently encoded echo signals after one RF excitation, e.g. correction for readout gradients of alternating polarity in EPI}	G01R33/565	G01R33/565		296
G01R33/56563	14	{caused by a distortion of the main magnetic field B0, e.g. temporal variation of the magnitude or spatial inhomogeneity of B0 (G01R33/56509, G01R33/56518, G01R33/56536 take precedence)}	G01R33/565	G01R33/565		763
G01R33/56572	14	{caused by a distortion of a gradient magnetic field, e.g. non-linearity of a gradient magnetic field (G01R33/56509, G01R33/56518, G01R33/56536 take precedence)}	G01R33/565	G01R33/565		288
G01R33/56581	15	{due to Maxwell fields, i.e. concomitant fields}	G01R33/565	G01R33/565		67
G01R33/5659	14	{caused by a distortion of the RF magnetic field, e.g. spatial inhomogeneities of the RF magnetic field (G01R33/56509, G01R33/56518, G01R33/56536 take precedence)}	G01R33/565	G01R33/565		575
G01R33/567	13	gated by physiological signals {, i.e. synchronization of acquired MR data with periodical motion of an object of interest, e.g. monitoring or triggering system for cardiac or respiratory gating}	G01R33/567	G01R33/567		102
G01R33/5673	14	{Gating or triggering based on a physiological signal other than an MR signal, e.g. ECG gating or motion monitoring using optical systems for monitoring the motion of a fiducial marker}	G01R33/567	G01R33/567		677
G01R33/5676	14	{Gating or triggering based on an MR signal, e.g. involving one or more navigator echoes for motion monitoring and correction}	G01R33/567	G01R33/567		462
G01R33/58	11	Calibration of imaging systems, e.g. using test probes {, Phantoms; Calibration objects or fiducial markers such as active or passive RF coils surrounding an MR active material}	G01R33/58	G01R33/58		725
G01R33/583	12	{Calibration of signal excitation or detection systems, e.g. for optimal RF excitation power or frequency (G01R33/246 takes precedence)}	G01R33/58	G01R33/58		345
G01R33/586	13	{for optimal flip angle of RF pulses}	G01R33/58	G01R33/58		56
G01R33/60	9	using electron paramagnetic resonance (G01R33/24, G01R33/62 take precedence)	G01R33/60	G01R33/60		594
G01R33/62	9	using double resonance (G01R33/24 takes precedence)	G01R33/62	G01R33/62		218
G01R33/64	9	using cyclotron resonance (G01R33/24 takes precedence)	G01R33/64	G01R33/64		29
G01R35/00	7	Testing or calibrating of apparatus covered by the other groups of this subclass	G01R35/00	G01R35/00		3800
G01R35/002	8	{of cathode ray oscilloscopes}	G01R35/00	G01R35/00		69
G01R35/005	8	{Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references (G01R33/0035, G01R35/002 take precedence)}	G01R35/00	G01R35/00		4673
G01R35/007	9	{Standards or reference devices, e.g. voltage or resistance standards, "golden references"}	G01R35/00	G01R35/00		861
G01R35/02	8	of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating	G01R35/02	G01R35/02		3154
G01R35/04	8	of instruments for measuring time integral of power or current	G01R35/04	G01R35/04		4930
G01R35/06	9	by stroboscopic methods	G01R35/06	G01R35/06		11
