G01Q - Definition

Definition statement

This subclass covers:

Scanning probes, i.e. devices having at least a tip of nanometre sized dimensions that scans or moves over an object surface, typically at a distance of a few angstroms or nanometres, monitoring some interaction between the tip and the surface, e.g. monitoring the generation of a tunnelling current.

Techniques or apparatus involving the use of scanning probes.

The following subjects are therefore covered, the list being non-exhaustive:

• scanning probes per se, their manufacture or their related instrumentation, e.g. holders;
• scanning-probe microscopy (SPM) or microscopes, i.e. the application of scanning probes to the investigation or analysis of a surface structure in atomic ranges;
• applications, other than SPM, involving the use of scanning probes.

Special rules of classification

In this subclass, the first place priority rule is applied, i.e. at each hierarchical level, classification is made in the first appropriate place.