“JPO-CNIPA Trial and Appeal Experts Meeting (TAEM),” “Joint Experts Group for Trial and Appeal (JEGTA),” and opinion exchange meetings with users Held.

December 20, 2023

The Trial and Appeal Department (TAD) of the Japan Patent Office (JPO), the Patent Reexamination and Invalidation Department of the Patent Office, China National Intellectual Property Administration (CNIPA), and the Intellectual Property Trial and Appeal Board (IPTAB) of the Korean Intellectual Property Office (KIPO) held the 9th JPO-CNIPA Trial and Appeal Experts Meeting (TAEM) on December 11, the 10th JPO-CNIPA-KIPO Joint Experts Group for Trial and Appeal (JEGTA) on December 12, and opinion exchange meetings with users on December 13, 2023 in Tokyo.

At the 9th JPO-CNIPA TAEM, the experts discussed issues including “Cases for filing multiple petitions for an invalidation trial against one patent right” and “Proceedings of Partial Designs.” At the JEGTA, the experts discussed issues including “Requirements for Post-Grant Patent Corrections (Amendments)” and “Improving Efficiency of Trial and Appeal Operations.”

Furthermore, opinion exchange meetings with users were held inviting the Japan Intellectual Property Association (JIPA) and the Japan Patent Attorneys Association (JPAA) on December 13, 2023. At the Japan-China opinion exchange meeting with users, the CNIPA introduced the “Report on the Current Status and Statistics of Trial/Appeal, CNIPA” and “the main examination standards of partial design patent in China” as well as “Efforts to improve convenience for users through legal revisions and operations.” At the Japan-Korea opinion exchange meeting with users, the KIPO introduced the “Overview and Recent Developments of the IPTAB” and “Efforts to Improve User Convenience.”

The JPO will continue to actively foster various exchange programs with other Offices in the field of trials and appeals, endeavoring to improve transparency in the dispute resolution system across the world.

Participants at the 9th JPO-CNIPA Trial and Appeal Experts Meeting (TAEM).
Front row, second from left: LIU Ming, Deputy Director-General, Reexamination and Invalidation Department of the Patent Office, CNIPA, front row, third from left: TAMURA Kiyoko, Executive Chief Administrative Judge of the TAD, JPO

Participants at the 10th JPO-CNIPA-KIPO Joint Experts Group for Trial and Appeal (JEGTA).
Front row, second from left: KIM Heetae, Chief Presiding Administrative Judge (Director-General) of the KIPO,
front row, third from left: YASUDA Futoshi, Director-General of the TAD, JPO,
front row, forth from left: TAMURA Kiyoko, Executive Chief Administrative Judge of the TAD, JPO,
front row, fifth from left: LIU Ming, Deputy Director-General, Reexamination and Invalidation Department of the Patent Office, CNIPA

The Japan-China opinion exchange meeting with users

The Japan-Korea opinion exchange meeting with users

[Last updated 20 December 2023]