The 11th “Joint Experts Group for Trial and Appeal (JEGTA)” and the 10th “JPO-CNIPA Trial and Appeal Experts Meeting (TAEM)” Held

December 20, 2024

On November 19, 2024, the 10th JPO-CNIPA Trial and Appeal Experts Meeting (TAEM) was held between the Trial and Appeal Department (TAD) of the Japan Patent Office (JPO) and the Patent Reexamination and Invalidation Department (PRD) of the China National Intellectual Property Administration (CNIPA) at the CNIPA in China. Then, the 11th JPO-CNIPA-KIPO Joint Experts Group for Trial and Appeal (JEGTA) was held on November 20 with the addition of the Intellectual Property Trial and Appeal Board (IPTAB) of the Korean Intellectual Property Office (KIPO) and the Trial and Appeal User Forum among CNIPA, JPO and KIPO was held on November 21, 2024.

At the 10th JPO-CNIPA TAEM, the experts discussed “the protection of standard essential patent" and “how to fully utilize the procedural role of reconsideration." At the 11th JEGTA, the experts discussed “quality management and elevation of the examination" and “examination of customized parameter-limited claims." At the Trial and Appeal User Forum, the Three Offices presented “report on key activities and areas of interest" and “efforts to improve convenience for users of the trial/appeal systems" respectively.

The JPO will continue to actively foster various exchange programs with other Offices in the field of trials and appeals, endeavoring to improve transparency in the dispute resolution system across the world.

Participants at the 11th JPO-CNIPA-KIPO Joint Experts Group for Trial and Appeal (JEGTA).

Front row, fourth from left:
LEE Hojo, Chief Presiding Administrative Judge (Director-General),
Board 7, of the Intellectual Property Trial and Appeal Board (IPTAB), KIPO;
Front row, fifth from left:
Gao Xin, Director-General of the Patent Reexamination and Invalidation Department (PRD), CNIPA;
Front row, sixth from left:
MORIFUJI Atsushi, Executive Chief Administrative Judge of the Trial and Appeal Department (TAD), JPO.

Participants at the 10th JPO-CNIPA Trial and Appeal Experts Meeting (TAEM).

Front row, second from left:
Feng Xianping, Deputy Director-General of the Patent Reexamination and Invalidation Department (PRD), CNIPA;
Front row, third from left:
MORIFUJI Atsushi, Executive Chief Administrative Judge of the TAD, JPO.

Trial and Appeal User Forum among CNIPA, JPO and KIPO.

[Last updated 20 December 2024]