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Home> Announcements> Photo Gallery> December 2025> JPO-OEPM Examiner Exchange Program Held

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JPO-OEPM Examiner Exchange Program Held

December 4, 2025

From November 17 to 21, 2025, the Japan Patent Office (JPO) held an Examiner Exchange Program* with the Spanish Patent and Trademark Office (OEPM).

The two Offices previously held the program from 2011 to 2013. This year, it was held again for the first time since then. It was also the first time the JPO hosted OEPM examiners.

A total of 13 patent examiners from JPO and 6 examiners from OEPM participated. Discussions were held on common patent cases in five technical fields: Dynamo-Electronic Machines and Control, Heating, Refrigerating and Air-conditioning Engineering, Medical Device, Genetic Engineering, and Cell Engineering.

In addition, the participants exchanged information on prior art search methods, the application of examination guidelines. There were also discussions on user-oriented initiatives and efforts utilizing AI. Through these activities, both offices deepened their mutual understanding.

The JPO will continue to cooperate on patent examination with IP Offices of other countries.

* The Examiner Exchange Program is designed to foster a relationship of trust and deepen mutual understanding between the examiners of the JPO and those of an overseas IP Office and to promote mutual use of prior art search results and examination results through discussions on each other's prior art search methods and examination practices.
 

(Photo-1) Participants from both offices
Participants from both offices

(Photo-2) Exchange of opinions
Exchange of opinions

(Photo-3) Discussions in each technical field (1)
Discussions in each technical field (1)

(Photo-4) Discussions in each technical field (2)
Discussions in each technical field (2)

[Last updated 4 December 2025]